1. Determining p-n junction parameters from photocurrent spectra

   • E. N. Pyatyshev
   • D. V. Kuzichev

   OriginalPaper Pages: 851 - 854

2. Built-in control subsystem of the integrated design and production system for machining of components

   • V. E. Mager
   • V. N. Tisenko
   • L. V. Chernen'kaya

   OriginalPaper Pages: 855 - 857

3. A new method of product control on the basis of the logic of antonyms

   • Ya. Ya. Golota

   OriginalPaper Pages: 858 - 861

4. Automatic control of industrial processes (an antonym-logic approach)

   • Ya. Ya. Golota
   • O. V. Kolosova
   • A. Yu. Chursina

   OriginalPaper Pages: 861 - 865

5. A performance parameter and data support in optimizing semiconductor-detector spectrometry conditions

   • V. M. Malykhin

   OriginalPaper Pages: 866 - 869

6. Theory and technique for measuring the parameters of UHF transistors and transistor structures

   • S. M. Nikulin

   OriginalPaper Pages: 869 - 871

7. Preliminary data of a comprehensive method for certification of waveguide thermal noise generators

   • O. G. Petrosyan
   • M. V. Sargsyan

   OriginalPaper Pages: 872 - 873

8. Checking the geometry of the components of slow-wave structures

   • V. M. Demin
   • L. I. Kalinina
   • Yu. V. Filimonov

   OriginalPaper Pages: 874 - 876

9. A digital printed-board diagnosis and test generation system

   • V. N. Mal'tsev

   OriginalPaper Pages: 876 - 879

10. Reference voltage ratio meter and its application to analog-digital and digital-analog conversion linearity error measurements

    • A. A. Bragin
    • G. A. Zil'berman

    OriginalPaper Pages: 879 - 882

11. Multichannel microprocessor system for technological process control and supervision

    • L. S. Zaslavskii
    • I. V. Vasilenko
    • M. I. Shterenberg

    OriginalPaper Pages: 882 - 884

12. New hybrid microcircuits for electrical measuring instruments

    • V. V. Ostroverkhov
    • I. L. Smelyanskii
    • G. I. Yakovlev

    OriginalPaper Pages: 884 - 887

13. Laser atomic-fluorescence and atomic-ionization spectrometers

    • S. V. Gorbunov
    • D. E. Milovzorov
    • V. A. Shishlakov

    OriginalPaper Pages: 888 - 890

14. IVK-test: A system of parametric control of the test structures of LSI and VLSI boards

    • A. M. Averbukh
    • V. A. Komshilova
    • A. A. Smirnov

    OriginalPaper Pages: 891 - 893

15. Flexible production lines and testing and measurement operation support

    • V. K. Matselevich
    • A. P. Naumov

    OriginalPaper Pages: 894 - 895

16. A new method for measuring the thickness of two-layer film materials

    • A. A. Emel'yanov

    OriginalPaper Pages: 896 - 899

17. An automaton for noncontact testing of male threading

    • A. A. Ivanov
    • V. I. Mironchenko
    • V. N. Shishov

    OriginalPaper Pages: 900 - 903

18. Effects of beam pattern instability on dispersion line accuracy in phase locking of separated lasers

    • N. A. Armand
    • V. I. Grigor'evskii
    • A. N. Lomakin

    OriginalPaper Pages: 904 - 905

19. Determining permissible Doppler lidar beam deviation angles in wind speed measurement

    • A. A. Kormakov
    • L. A. Kosovskii
    • G. A. Pogosov

    OriginalPaper Pages: 906 - 911

20. Remote sensing of aerosol parameters from laser breakdown characteristics

    • N. N. Belov

    OriginalPaper Pages: 912 - 916

21. Combined velocity, size, and concentration measurement for particles in a two-phase flow

    • B. A. Pavlovskii
    • N. V. Semidetnov

    OriginalPaper Pages: 917 - 921

22. A photoelectric aerosol counter containing a scanned laser beam

    • S. M. Kolomiets

    OriginalPaper Pages: 922 - 925

23. Verification procedure for vibration parameter measurement devices

    • A. E. Manokhin
    • V. Ya. Smirnov

    OriginalPaper Pages: 926 - 928

24. Monitoring liquid fuel consumption in locomotive diesel engines

    • B. M. Levin
    • V. V. Domogatskii
    • A. N. Zolotov

    OriginalPaper Pages: 928 - 934

25. Calibration characteristics of copper resistance thermometers in the range from 77 to 273 K

    • E. A. Tombasov
    • Z. P. Chepurnaya
    • V. V. Yakunin

    OriginalPaper Pages: 935 - 938

26. Measuring elongations with high-accuracy interference dilatometers

    • S. S. Popov

    OriginalPaper Pages: 939 - 941

27. Limits in the operation of instruments for the measurement of the mean square value of nonsinusoidal signals

    • E. Nowaczyk

    OriginalPaper Pages: 942 - 947

28. Generation of precision amplitude-modulated signals

    • M. Ya. Mints
    • V. N. Chinkov

    OriginalPaper Pages: 948 - 953

29. Improving the accuracy and efficiency of measurement of low signal-harmonic factors

    • I. A. Teshev

    OriginalPaper Pages: 953 - 958

30. A calorimetric apparatus for measuring⁵¹cr activities at ∼4·10¹⁶ Bq in an artificial neutrino source

    • I. N. Belousov
    • E. A. Khol'nova
    • V. É. Yants

    OriginalPaper Pages: 959 - 961

31. Errors in determining particle mass distribution with conductometric counters

    • V. I. Lashmanov
    • P. N. Montik
    • A. M. Aleshin

    OriginalPaper Pages: 962 - 965