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IVK-test: A system of parametric control of the test structures of LSI and VLSI boards

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Measurement Techniques Aims and scope

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Literature cited

  1. A. M. Averbukh and A. A. Smirnov, Systemic Devices in Electric Measurement Technology: A Collection of Papers [in Russian], Leningrad (1990).

  2. S. M. Kuzin, V. N. Panasyuk, V. G. Mokerov, and V. V. Isaev, Electric Testing in the Manufacture of Integrated Circuits [in Russian], TsNII Élektronika, Moscow (1989).

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  3. V. O. Kolbasov et al., Elektron. Promyst., No. 12, 18 (1989).

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  4. N. N. Vostroknutov, V. M. Malyshev, and G. N. Solopchenko, Izmer. Tekh., No. 11, 16 (1987).

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Authors
  1. A. M. Averbukh
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  2. V. A. Komshilova
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  3. V. M. Malyshev
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  4. T. G. Osipova
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  5. A. A. Smirnov
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 9, pp. 26–27, September, 1991.

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Averbukh, A.M., Komshilova, V.A., Malyshev, V.M. et al. IVK-test: A system of parametric control of the test structures of LSI and VLSI boards. Meas Tech 34, 891–893 (1991). https://doi.org/10.1007/BF00980796

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  • DOI: https://doi.org/10.1007/BF00980796

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