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Translated from Izmeritel'naya Tekhnika, No. 9, pp. 29–30, September, 1991.
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Emel'yanov, A.A. A new method for measuring the thickness of two-layer film materials. Meas Tech 34, 896–899 (1991). https://doi.org/10.1007/BF00980798
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DOI: https://doi.org/10.1007/BF00980798