Determining p-n junction parameters from photocurrent spectra E. N. PyatyshevD. V. Kuzichev OriginalPaper Pages: 851 - 854
Built-in control subsystem of the integrated design and production system for machining of components V. E. MagerV. N. TisenkoL. V. Chernen'kaya OriginalPaper Pages: 855 - 857
A new method of product control on the basis of the logic of antonyms Ya. Ya. Golota OriginalPaper Pages: 858 - 861
Automatic control of industrial processes (an antonym-logic approach) Ya. Ya. GolotaO. V. KolosovaA. Yu. Chursina OriginalPaper Pages: 861 - 865
A performance parameter and data support in optimizing semiconductor-detector spectrometry conditions V. M. Malykhin OriginalPaper Pages: 866 - 869
Theory and technique for measuring the parameters of UHF transistors and transistor structures S. M. Nikulin OriginalPaper Pages: 869 - 871
Preliminary data of a comprehensive method for certification of waveguide thermal noise generators O. G. PetrosyanM. V. Sargsyan OriginalPaper Pages: 872 - 873
Checking the geometry of the components of slow-wave structures V. M. DeminL. I. KalininaYu. V. Filimonov OriginalPaper Pages: 874 - 876
A digital printed-board diagnosis and test generation system V. N. Mal'tsev OriginalPaper Pages: 876 - 879
Reference voltage ratio meter and its application to analog-digital and digital-analog conversion linearity error measurements A. A. BraginG. A. Zil'berman OriginalPaper Pages: 879 - 882
Multichannel microprocessor system for technological process control and supervision L. S. ZaslavskiiI. V. VasilenkoM. I. Shterenberg OriginalPaper Pages: 882 - 884
New hybrid microcircuits for electrical measuring instruments V. V. OstroverkhovI. L. SmelyanskiiG. I. Yakovlev OriginalPaper Pages: 884 - 887
Laser atomic-fluorescence and atomic-ionization spectrometers S. V. GorbunovD. E. MilovzorovV. A. Shishlakov OriginalPaper Pages: 888 - 890
IVK-test: A system of parametric control of the test structures of LSI and VLSI boards A. M. AverbukhV. A. KomshilovaA. A. Smirnov OriginalPaper Pages: 891 - 893
Flexible production lines and testing and measurement operation support V. K. MatselevichA. P. Naumov OriginalPaper Pages: 894 - 895
A new method for measuring the thickness of two-layer film materials A. A. Emel'yanov OriginalPaper Pages: 896 - 899
An automaton for noncontact testing of male threading A. A. IvanovV. I. MironchenkoV. N. Shishov OriginalPaper Pages: 900 - 903
Effects of beam pattern instability on dispersion line accuracy in phase locking of separated lasers N. A. ArmandV. I. Grigor'evskiiA. N. Lomakin OriginalPaper Pages: 904 - 905
Determining permissible Doppler lidar beam deviation angles in wind speed measurement A. A. KormakovL. A. KosovskiiG. A. Pogosov OriginalPaper Pages: 906 - 911
Remote sensing of aerosol parameters from laser breakdown characteristics N. N. Belov OriginalPaper Pages: 912 - 916
Combined velocity, size, and concentration measurement for particles in a two-phase flow B. A. PavlovskiiN. V. Semidetnov OriginalPaper Pages: 917 - 921
A photoelectric aerosol counter containing a scanned laser beam S. M. Kolomiets OriginalPaper Pages: 922 - 925
Verification procedure for vibration parameter measurement devices A. E. ManokhinV. Ya. Smirnov OriginalPaper Pages: 926 - 928
Monitoring liquid fuel consumption in locomotive diesel engines B. M. LevinV. V. DomogatskiiA. N. Zolotov OriginalPaper Pages: 928 - 934
Calibration characteristics of copper resistance thermometers in the range from 77 to 273 K E. A. TombasovZ. P. ChepurnayaV. V. Yakunin OriginalPaper Pages: 935 - 938
Measuring elongations with high-accuracy interference dilatometers S. S. Popov OriginalPaper Pages: 939 - 941
Limits in the operation of instruments for the measurement of the mean square value of nonsinusoidal signals E. Nowaczyk OriginalPaper Pages: 942 - 947
Generation of precision amplitude-modulated signals M. Ya. MintsV. N. Chinkov OriginalPaper Pages: 948 - 953
Improving the accuracy and efficiency of measurement of low signal-harmonic factors I. A. Teshev OriginalPaper Pages: 953 - 958
A calorimetric apparatus for measuring51cr activities at ∼4·1016 Bq in an artificial neutrino source I. N. BelousovE. A. Khol'novaV. É. Yants OriginalPaper Pages: 959 - 961
Errors in determining particle mass distribution with conductometric counters V. I. LashmanovP. N. MontikA. M. Aleshin OriginalPaper Pages: 962 - 965
