Volume 34, Issue 3

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June 2018

Special Issue on Analog, Mixed-Signal and RF Testing

Issue Editors:

Ke Huang,
Manuel J. Barragan

15 articles in this issue

Editorial
Vishwani D. Agrawal
EditorialNotes 09 May 2018 Pages: 209 - 209
Test Technology Newsletter

News 07 May 2018 Pages: 211 - 212
Guest Editorial: Special Issue on Analog, Mixed-Signal, and RF Testing
Ke Huang
Manuel J. Barragan
EditorialNotes 02 May 2018 Pages: 213 - 214
A Distortion Shaping Technique to Equalize Intermodulation Distortion Performance of Interpolating Arbitrary Waveform Generators in Automated Test Equipment
Peter Sarson
Tomonori Yanagida
Haruo Kobayashi
OriginalPaper 04 January 2018 Pages: 215 - 232
Measuring Group Delay of Frequency Downconverter Devices Using a Chirped RF Modulated Signal
Peter Sarson
Tomonori Yanagida
Kosuke Machida
OriginalPaper 10 February 2018 Pages: 233 - 253
Digital Predistortion for Spectrum Compliance in the Internet of Things
Siyuan Yan
Xiao Li
Fu Li
OriginalPaper 27 April 2018 Pages: 255 - 262
Practical Harmonic Cancellation Techniques for the On-Chip Implementation of Sinusoidal Signal Generators for Mixed-Signal BIST Applications
Hani Malloug
Manuel J. Barragan
Salvador Mir
OriginalPaper 22 March 2018 Pages: 263 - 279
On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints
Stephane David-Grignot
Achraf Lamlih
Serge Bernard
OriginalPaper 10 February 2018 Pages: 281 - 290
Security Enhancements of a Mutual Authentication Protocol Used in a HF Full-Fledged RFID Tag
Yassine Naija
Vincent Beroulle
Mohsen Machhout
OriginalPaper 17 April 2018 Pages: 291 - 304
Golden-Free Processor Hardware Trojan Detection Using Bit Power Consistency Analysis
Yang Zhang
Houde Quan
Kaiyan Chen
OriginalPaper 17 March 2018 Pages: 305 - 312
A Time-Domain Digital-Intensive Built-In Tester for Analog Circuits
Congyin Shi
Sanghoon Lee
Edgar Sánchez-Sinencio
OriginalPaper 19 February 2018 Pages: 313 - 320
A Classification Approach for an Accurate Analog/RF BIST Evaluation Based on the Process Parameters
Ahcène Bounceur
Samia Djemai
Reinhardt Euler
OriginalPaper 03 May 2018 Pages: 321 - 335
Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning
Parth Kansara
Sharanabasavaraja Bheema Reddy
Ke Huang
OriginalPaper 12 April 2018 Pages: 337 - 349
Gate Oxide Short Defect Model in FinFETs
Roya Dibaj
Dhamin Al-Khalili
Maitham Shams
OriginalPaper 14 April 2018 Pages: 351 - 362
Reliability Testing of 3D-Printed Electromechanical Scanning Devices
B. Mert Gönültaş
Janset Savaş
Onur Ferhanoğlu
OriginalPaper 27 March 2018 Pages: 363 - 370

Volume 34, Issue 3

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