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Mapping of Yr62 and a small-effect QTL for high-temperature adult-plant resistance to stripe rust in spring wheat PI 192252

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This manuscript reports a new gene (Yr62) and a small-effect QTL for potentially durable resistance to stripe rust and usefulness of Yr62 markers for marker-assisted selection.

Abstract

Stripe rust, caused by Puccinia striiformis f. sp. tritici (Pst), is a devastating disease of wheat worldwide. Spring wheat germplasm PI 192252 showed a high level of high-temperature adult-plant (HTAP) resistance to stripe rust in germplasm evaluation over 8 years in the State of Washington. To elucidate the genetic basis of resistance, PI 192252 was crossed with ‘Avocet susceptible’. A mapping population of 150 F5 recombinant inbred lines was developed using single-seed descent. Stripe rust tests were conducted with selected Pst races in a greenhouse and in field conditions under natural infections. The relative area under the disease progress curve (rAUDPC) data showed continuous distributions, indicating that HTAP resistance of PI 192252 was controlled by quantitative trait loci (QTL). Two QTL were identified in PI 192252, explaining 74.2 % of the total phenotypic variation for rAUDPC. These two QTL were mapped to chromosomes 4BL (QYrPI192252.wgp-4BL) and 5BS (QYrPI192252.wgp-5BS) with SSR and SNP markers and explained 40–60 and 22–27 %, respectively, of the phenotypic variation across the four environments. Because the major-effect QTL on 4BL is different from previously named Yr genes and inherited as a single gene, it is named Yr62. The SSR marker alleles Xgwm192 222 and Xgwm251 133 flanking Yr62 were different from the alleles in various wheat varieties, suggesting that these markers could be useful in marker-assisted selection for incorporating Yr62 into commercial cultivars.

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Acknowledgments

This research was supported by the US Department of Agriculture, Agricultural Research Service (Project No. 5348-22000-015-00D) and Washington State University (Project No. 13C-3061-5665 and 13Z-3061-6665) PPNS No. 0650, Department of Plant Pathology, College of Agricultural, Human, and Natural Resource Sciences, Agricultural Research Center, HATCH Project Number WNP00663, Washington State University, Pullman, WA 99164-6430, USA. The research is also part of the Northwest A&F University Plant Pathology the “973” project (2013CB127700) and ‘‘111’’ Project (B07049). The China Scholarship Council scholarship to Yan Lu is greatly appreciated. We thank Dr. Robert McIntosh and Dr. Mike Pumphrey for critical review of the manuscript.

Conflict of interest

None.

Ethical standards

All experiments were conducted in Pullman, Washington, the USA, and part of data analyses and manuscript development were done at Northwest A&F University. All authors have contributed to the study and approved the version for submission. The manuscript has not been submitted to any other journal.

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Authors and Affiliations

  1. State Key Laboratory of Crop Stress Biology in Arid Areas and College of Plant Protection, Northwest A&F University, Yangling, Shaanxi, 712100, People’s Republic of China

    Yan Lu & Jinxue Jing

  2. Department of Plant Pathology, Washington State University, Pullman, WA, 99164-6430, USA

    Yan Lu, Meinan Wang, Xianming Chen & Deven See

  3. US Department of Agriculture, Agricultural Research Service, Wheat Genetics, Quality, Physiology and Disease Research Unit, Pullman, WA, 99164-6430, USA

    Xianming Chen & Deven See

  4. US Department of Agriculture, Agricultural Research Service, Cereal Crops Research, Fargo, ND, 58102-2775, USA

    Shiaoman Chao

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  1. Yan Lu
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  4. Deven See
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Correspondence to Xianming Chen.

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Communicated by X. Xia.

Mention of trade names or commercial products in this publication is solely for the purpose of providing specific information and does not imply recommendation or endorsement by the US Department of Agriculture. USDA is an equal opportunity provider and employer.

Y. Lu and M. Wang made equal contributions.

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Lu, Y., Wang, M., Chen, X. et al. Mapping of Yr62 and a small-effect QTL for high-temperature adult-plant resistance to stripe rust in spring wheat PI 192252. Theor Appl Genet 127, 1449–1459 (2014). https://doi.org/10.1007/s00122-014-2312-0

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