Overview
- Includes supplementary material: sn.pub/extras
Part of the book series: Advanced Texts in Physics (ADTP)
Access this book
Tax calculation will be finalised at checkout
Other ways to access
About this book
Similar content being viewed by others
Keywords
Table of contents (14 chapters)
-
Experimental Realization
-
Basic Principles
-
X-Ray Scattering by Laterally Structured Semiconductor Nano-Structures
Authors and Affiliations
Bibliographic Information
Book Title: High-Resolution X-Ray Scattering
Book Subtitle: From Thin Films to Lateral Nanostructures
Authors: Ullrich Pietsch, Václav Holý, Tilo Baumbach
Series Title: Advanced Texts in Physics
DOI: https://doi.org/10.1007/978-1-4757-4050-9
Publisher: Springer New York, NY
-
eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 2004
Hardcover ISBN: 978-0-387-40092-1Published: 27 August 2004
Softcover ISBN: 978-1-4419-2307-3Published: 12 December 2011
eBook ISBN: 978-1-4757-4050-9Published: 09 March 2013
Series ISSN: 1439-2674
Edition Number: 2
Number of Pages: XVI, 408
Number of Illustrations: 389 b/w illustrations
Additional Information: Originally published as Volume 149 in the series: Springer Tracts in Modern Physics
Topics: Surfaces and Interfaces, Thin Films, Optical and Electronic Materials, Nanotechnology, Optics, Lasers, Photonics, Optical Devices