Advertisement

X-Ray Scattering by Rough Multilayers

  • Ullrich Pietsch
  • Václav Holý
  • Tilo Baumbach
Part of the Advanced Texts in Physics book series (ADTP)

Abstract

This chapter deals with theoretical and experimental aspects of x-ray reflection and diffraction by thin layers and multilayers with rough interfaces illustrated by various examples. We describe the scattering potential of rough multilayers for x-ray reflection and later for x-ray diffraction; the multilayers are characterized by point properties and the correlation properties of their interfaces. General formulae are derived for the coherent part of the specularly scattered intensity by means of the coherent approach. The incoherent approach introduced in Chapter 5 is used for the calculation of the non-specularly scattered intensity. The end of the chapter discusses briefly the extension of the formalism to surface-sensitive diffraction methods.

Keywords

Scattered Wave Diffuse Scattering Interface Roughness Roughness Profile Rough Interface 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Copyright information

© Springer Science+Business Media New York 2004

Authors and Affiliations

  • Ullrich Pietsch
    • 1
  • Václav Holý
    • 2
  • Tilo Baumbach
    • 3
  1. 1.Institute of PhysicsUniversity of PotsdamPotsdamGermany
  2. 2.Department of Solid State PhysicsMasaryk UniversityBrnoCzech Republic
  3. 3.Institut fuer SynchrotronstrahlungForschungszentrum Karlsruhe in der Helmholtz-GemeinschaftKarlsruheGermany

Personalised recommendations