Volume 117, Issue 4
December 2014Focused Electron Beam Induced Processing: From Fundamentals Towards Applications
- Issue Editor:
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- Harald Plank
80 articles in this issue
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Focused-electron-beam-induced processing (FEBIP) for emerging applications in carbon nanoelectronics
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Spatial chemistry evolution during focused electron beam-induced deposition: origins and workarounds
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Electron dynamics and prompt ablation of aluminum surface excited by intense femtosecond laser pulse
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Modeling of the rough spherical nanoparticles manipulation on a substrate based on the AFM nanorobot
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