1. Foreword

   EditorialNotes Pages: 959 - 959

2. Molecular view of diamond CVD growth

   • C. C. Battaile
   • D. J. Srolovitz
   • J. E. Butler

   OriginalPaper Pages: 960 - 965

3. Surface and interface stress effects on the growth of thin films

   • R. C. Cammarata

   OriginalPaper Pages: 966 - 968

4. Real-time stress evolution during Si_1-xGe_x Heteroepitaxy: Dislocations, islanding, and segregation

   • J. A. Floro
   • E. Chason
   • L. B. Freund

   OriginalPaper Pages: 969 - 979

5. Adhesion of CVD tin on 316l surgical stainless steel obtained in a mass transfer regime

   • M. H. Staia
   • E. S. Puchi
   • C. Julia Schmutz

   OriginalPaper Pages: 980 - 986

6. Some further microstructural characteristics of face-centered cubic polycrystalline metal thin films

   • Varun V. Singh
   • Alexander H. King
   • Girish Dixit

   OriginalPaper Pages: 987 - 995

7. Local textures and grain boundaries in voided copper interconnects

   • R. R. Keller
   • J. A. Nucci
   • D. P. Field

   OriginalPaper Pages: 996 - 1001

8. Elastic modulus measurement of thin film using a dynamic method

   • Youngman Kim

   OriginalPaper Pages: 1002 - 1008

9. Evolution of grain structure in thin film reactions

   • K. Barmak
   • J. M. Rickman
   • C. Michaelsen

   OriginalPaper Pages: 1009 - 1020

10. Stress relaxation and thermal evolution of film properties in amorphous carbon

    • J.P Sullivan
    • T. A. Friedmann
    • A. G. Baca

    OriginalPaper Pages: 1021 - 1029

11. Glancing-angle ion bombardment for modification and monitoring of semiconductor surfaces

    • J. G. C. Labanda
    • S. A. Barnett

    OriginalPaper Pages: 1030 - 1038

12. Mechanisms of strain induced roughening and dislocation multiplication in Si_xGe_1-xthin films

    • D. E. Jesson
    • K. M. Chen
    • R. J. Warmack

    OriginalPaper Pages: 1039 - 1047

13. Spontaneous lateral composition modulation in AlAs/InAs short period superlattices via the growth front

    • J. Mirecki Millunchick
    • R. D. Twesten
    • A. Mascarenhas

    OriginalPaper Pages: 1048 - 1052

14. Structural stability of low temperature grown InGaAs/GaAs heterostructure

    • Chanro Park
    • C. G. Park
    • S. K. Noh

    OriginalPaper Pages: 1053 - 1057

15. Fatigue-creep crack propagation path in solder joints under thermal cycling

    • D. R. Liu
    • Yi-Hsin Pao

    OriginalPaper Pages: 1058 - 1064

16. Analysis of iodine incorporation in mbe grown CdTe and HgCdTe

    • A. Parikh
    • S.D. Pearson
    • C.J. Summers

    OriginalPaper Pages: 1065 - 1069

17. Electromigration in aluminum/silicon/copper metallization due to the presence of a thin oxide layer

    • K.A. Koh
    • S.J. Chua

    OriginalPaper Pages: 1070 - 1075

18. Characteristics of Si₃N₄/GaAs metal-lnsulator-semiconductor interfaces with coherent Si/Al_0.3Ga_0.7As interlayers

    • Dae-Gyu Park
    • Zhi Chen
    • Hadis Morkoç

    OriginalPaper Pages: 1076 - 1082

19. Continuous in situ growth rate extraction using pyrometric interferometry and laser reflectance measurement during molecular beam epitaxy

    • J.J. Zhou
    • Y. Li
    • F.G. Celii

    OriginalPaper Pages: 1083 - 1089

20. Crystallographic texture of C54 titanium disilicide as a function of deep submicron structure geometry

    • V. Svilan
    • K.P. Rodbell
    • J. M. E. Harper

    OriginalPaper Pages: 1090 - 1095