Molecular view of diamond CVD growth C. C. BattaileD. J. SrolovitzJ. E. Butler OriginalPaper Pages: 960 - 965
Surface and interface stress effects on the growth of thin films R. C. Cammarata OriginalPaper Pages: 966 - 968
Real-time stress evolution during Si1-xGex Heteroepitaxy: Dislocations, islanding, and segregation J. A. FloroE. ChasonL. B. Freund OriginalPaper Pages: 969 - 979
Adhesion of CVD tin on 316l surgical stainless steel obtained in a mass transfer regime M. H. StaiaE. S. PuchiC. Julia Schmutz OriginalPaper Pages: 980 - 986
Some further microstructural characteristics of face-centered cubic polycrystalline metal thin films Varun V. SinghAlexander H. KingGirish Dixit OriginalPaper Pages: 987 - 995
Local textures and grain boundaries in voided copper interconnects R. R. KellerJ. A. NucciD. P. Field OriginalPaper Pages: 996 - 1001
Elastic modulus measurement of thin film using a dynamic method Youngman Kim OriginalPaper Pages: 1002 - 1008
Evolution of grain structure in thin film reactions K. BarmakJ. M. RickmanC. Michaelsen OriginalPaper Pages: 1009 - 1020
Stress relaxation and thermal evolution of film properties in amorphous carbon J.P SullivanT. A. FriedmannA. G. Baca OriginalPaper Pages: 1021 - 1029
Glancing-angle ion bombardment for modification and monitoring of semiconductor surfaces J. G. C. LabandaS. A. Barnett OriginalPaper Pages: 1030 - 1038
Mechanisms of strain induced roughening and dislocation multiplication in SixGe1-xthin films D. E. JessonK. M. ChenR. J. Warmack OriginalPaper Pages: 1039 - 1047
Spontaneous lateral composition modulation in AlAs/InAs short period superlattices via the growth front J. Mirecki MillunchickR. D. TwestenA. Mascarenhas OriginalPaper Pages: 1048 - 1052
Structural stability of low temperature grown InGaAs/GaAs heterostructure Chanro ParkC. G. ParkS. K. Noh OriginalPaper Pages: 1053 - 1057
Fatigue-creep crack propagation path in solder joints under thermal cycling D. R. LiuYi-Hsin Pao OriginalPaper Pages: 1058 - 1064
Analysis of iodine incorporation in mbe grown CdTe and HgCdTe A. ParikhS.D. PearsonC.J. Summers OriginalPaper Pages: 1065 - 1069
Electromigration in aluminum/silicon/copper metallization due to the presence of a thin oxide layer K.A. KohS.J. Chua OriginalPaper Pages: 1070 - 1075
Characteristics of Si3N4/GaAs metal-lnsulator-semiconductor interfaces with coherent Si/Al0.3Ga0.7As interlayers Dae-Gyu ParkZhi ChenHadis MorkoƧ OriginalPaper Pages: 1076 - 1082
Continuous in situ growth rate extraction using pyrometric interferometry and laser reflectance measurement during molecular beam epitaxy J.J. ZhouY. LiF.G. Celii OriginalPaper Pages: 1083 - 1089
Crystallographic texture of C54 titanium disilicide as a function of deep submicron structure geometry V. SvilanK.P. RodbellJ. M. E. Harper OriginalPaper Pages: 1090 - 1095