Temperature dependence of refractive index of Ta2O5 Dielectric Films A. K. ChuH. C. LinW. H. Cheng OriginalPaper Pages: 889 - 892
Low Resistance Contacts to p-CulnSe2 and p-CdTe Crystals M. K. RabinalI. LyubomirskyDavid Cahen OriginalPaper Pages: 893 - 897
Growth of thick gan films on rf sputtered ain buffer layer by hydride vapor phase epitaxy Heon LeeMasaaki YuriKyusik Sin OriginalPaper Pages: 898 - 902
The metalorganic chemical vapor deposition growth of AlAsSb and InAsSb/lnAs using novel source materials for Infrared Emitters R. M. BiefeldS. R. KurtzA. A. Allerman OriginalPaper Pages: 903 - 909
Rectifying Characteristics of Heterostructures with Diamond and Diamond- Like Carbon Films Ming-Rong ShenHao WangZhao-Xing Ren OriginalPaper Pages: 910 - 914
Cryogenic thermoelectric cooler with a passive branch C. Cipagauta MinoJ. W. CochraneG. J. Russell OriginalPaper Pages: 915 - 921
Type I and Type II Alignment of the Light Hole Band in In0.15Ga0.85As/GaAs and in ln0.15Ga0.85As/Al0.15Ga0.85As Strained Quantum Wells E. M. GoldysH. Y. ZuoT. L. Tansley OriginalPaper Pages: 922 - 927
Nickel filament polymer-matrix composites with low surface impedance and high electromagnetic interference shielding effectiveness Xiaoping ShuiD. D. L. Chung OriginalPaper Pages: 928 - 934
Chemical-Mechanical polishing of parylene- n films: evaluation by X-Ray photoelectron spectroscopy and atomic force microscopy G. -R. YangY. -P. ZhaoRonald J. Gutmann OriginalPaper Pages: 935 - 940
Patterning amorphous fluoropolymer films by reactive ion milling M. W. DenhoffMae Gao OriginalPaper Pages: 941 - 943
Determination of the Band Offset of GalnP- GaAs and AllnP- GaAs Quantum Wells by Optical Spectroscopy H. C. KuoJ. M. KuoG. E. Stillman OriginalPaper Pages: 944 - 948
Deposition of High Purity Parylene- F Using Low Pressure Low Temperature Chemical Vapor Deposition P. K. WuG. -R. YangH. Bakru OriginalPaper Pages: 949 - 953
Significantly Improved Mechanical Properties of Bi- Sn Solder Alloys by Ag- Doping M. MccormackH. S. ChenS. Jin OriginalPaper Pages: 954 - 958
Laser Recrystallization of Polycrystalline Silicon in Recessed Structures G. K. GiustT. W. Sigmon OriginalPaper Pages: L13 - L16
Copper metallizations for integrated circuits: tem analysis and electrical characterization P. BruschiC. CiofiB. Neri OriginalPaper Pages: L17 - L20
Direct evidence of au segregation in laser welded au-coated invar material S. C. WangS. ChiW. H. Cheng OriginalPaper Pages: L21 - L23