Structural properties of ZnO:Al films produced by the sol–gel technique E. P. ZaretskayaV. F. GremenokR. L. Juskenas Nonelectronic Properties of Semiconductors (Atomic Structure, Diffusion) 13 October 2015 Pages: 1253 - 1258
New mechanism of structuring associated with the quasi-merohedral twinning by an example of Ca1–x La x F2 + x ordered solid solutions S. K. MaksimovK. S. MaksimovM. V. Lovygin Nonelectronic Properties of Semiconductors (Atomic Structure, Diffusion) 13 October 2015 Pages: 1259 - 1269
Crossover between transport mechanisms in the region of the transition from sublinearity to superlinearity of the AC-conductivity frequency dependence for disordered semiconductors M. A. Ormont Electronic Properties of Semiconductors 13 October 2015 Pages: 1270 - 1275
Magnetic and electrical properties of Fe0.9Ag0.1In2.3S4.4 single crystals I. V. BodnarS. V. TrukhanovT. H. Barugu Electronic Properties of Semiconductors 13 October 2015 Pages: 1276 - 1280
Investigation of current instabilities in Mn4Si7–Si:Mn–Mn4Si7 and Mn4Si7–Si:Mn–M heterojunctions T. S. KamilovL. L. AksenovaI. V. Ernst Electronic Properties of Semiconductors 13 October 2015 Pages: 1281 - 1284
Increase in the diffusion length of minority carriers in Al x Ga1–x N alloys ( x = 0–0.1) fabricated by ammonia molecular beam epitaxy T. V. MalinA. M. GilinskyK. S. Zhuravlev Electronic Properties of Semiconductors 13 October 2015 Pages: 1285 - 1289
Influence of the ionization-energy losses of high-energy bismuth ions on the development of helium blisters in silicon V. F. ReutovS. N. DmitrievA. G. Zaluzhnyi Electronic Properties of Semiconductors 13 October 2015 Pages: 1290 - 1293
Detection of impurity diamagnetic susceptibility and its behavior in n-Ge:As in the region of the insulator–metal phase transition A. I. VeingerA. G. ZabrodskiiP. V. Semenikhin Electronic Properties of Semiconductors 13 October 2015 Pages: 1294 - 1301
Anisotropic mixed hole scattering mechanism in Sb2Te3–x Se x crystals (0 ≤ x ≤ 0.1) according to the data of the Nernst–Ettingshausen and seebeck effects S. A. NemovN. M. BlagikhL. D. Ivanova Electronic Properties of Semiconductors 13 October 2015 Pages: 1302 - 1306
On the charge neutrality level and the electronic properties of interphase boundaries in the layered ε-GaSe semiconductor V. N. BrudnyiS. Yu. SarkisovA. V. Kosobutsky Surfaces, Interfaces, and Thin Films 13 October 2015 Pages: 1307 - 1310
Binding energy of excitons formed from spatially separated electrons and holes in insulating quantum dots S. I. PokutnyiYu. N. KulchinV. P. Dzyuba Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena 13 October 2015 Pages: 1311 - 1315
Density dependence of electron mobility in the accumulation mode for fully depleted SOI films O. V. NaumovaE. G. ZaitsevaV. P. Popov Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena 13 October 2015 Pages: 1316 - 1322
Density of surface states in colloidal CdSe nanoplatelets A. V. KatsabaV. V. FedyaninR. B. Vasiliev Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena 13 October 2015 Pages: 1323 - 1326
Structure and optical transmission spectra of ZnS–SiO2 nanocomposite films deposited at low temperatures P. N. KrylovR. M. ZakirovaI. V. Fedotova Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena 13 October 2015 Pages: 1327 - 1331
Anomalously long lifetime of holes in silicon with nanoclusters of manganese atoms M. K. BakhadyrkhanovS. B. IsamovKh. U. Kamalov Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena 13 October 2015 Pages: 1332 - 1334
Emission spectra of a laser based on an In(Ga)As/GaAs quantum-dot superlattice M. M. SobolevM. S. BuyaloE. L. Portnoi Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena 13 October 2015 Pages: 1335 - 1340
Radiation hardness of n-GaN schottky diodes A. A. LebedevS. V. BelovV. V. Kozlovski Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena 13 October 2015 Pages: 1341 - 1343
Polaron mass of charge carriers in semiconductor quantum wells A. Yu. MaslovO. V. Proshina Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena 13 October 2015 Pages: 1344 - 1347
Current–voltage characteristics of disordered organic layers under space-charge-limited conditions based on the transport level concept V. R. NikitenkoA. Yu. Saunina Amorphous, Vitreous, and Organic Semiconductors 13 October 2015 Pages: 1348 - 1351
X-ray fluorescence analysis of Ge1–x Se x , As1–x Se x , and Ge1–x–y As y Se x glasses using electronic excitation E. I. TerukovP. P. SereginK. U. Bobokhuzhaev Amorphous, Vitreous, and Organic Semiconductors 13 October 2015 Pages: 1352 - 1356
Zinc-oxide-based nanostructured materials for heterostructure solar cells A. A. BobkovA. I. MaximovE. I. Terukov Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors 13 October 2015 Pages: 1357 - 1360
Comparative investigation of InGaP/GaAs/GaAsBi and InGaP/GaAs heterojunction bipolar transistors Yi-Chen WuJung-Hui TsaiFu-Min Wang Physics of Semiconductor Devices 13 October 2015 Pages: 1361 - 1364
Photodetectors on the basis of Ge/Si(001) heterostructures grown by the hot-wire CVD technique V. G. ShengurovV. Yu. ChalkovD. O. Filatov Physics of Semiconductor Devices 13 October 2015 Pages: 1365 - 1368
Whispering gallery modes in a spherical microcavity with a photoluminescent shell S. A. GrudinkinA. A. DontsovV. G. Golubev Physics of Semiconductor Devices 13 October 2015 Pages: 1369 - 1374
Study of silicon production processes and development of solar-cell fabrication technologies B. N. MukashevA. A. BetekbaevD. M. Skakov Fabrication, Treatment, and Testing of Materials and Structures 13 October 2015 Pages: 1375 - 1382
Properties of AlN films deposited by reactive ion-plasma sputtering N. A. BertA. D. BondarevI. S. Tarasov Fabrication, Treatment, and Testing of Materials and Structures 13 October 2015 Pages: 1383 - 1387
Metamorphic distributed Bragg reflectors for the 1440–1600 nm spectral range: Epitaxy, formation, and regrowth of mesa structures A. Yu. EgorovL. Ya. KarachinskyV. N. Nevedomskiy Fabrication, Treatment, and Testing of Materials and Structures 13 October 2015 Pages: 1388 - 1392