An On-Chip Sensor to Monitor NBTI Effects in SRAMs A. CerattiT. CopettiR. Fagundes OriginalPaper 15 April 2014 Pages: 159 - 169
An RTN Variation Tolerant SRAM Screening Test Design with Gaussian Mixtures Approximations of Long-Tail Distributions Worawit SomhaHiroyuki Yamauchi OriginalPaper 11 March 2014 Pages: 171 - 181
Error Correction Schemes with Erasure Information for Fast Memories Samuel EvainValentin SavinValentin Gherman OriginalPaper 21 March 2014 Pages: 183 - 192
Developing Inherently Resilient Software Against Soft-Errors Based on Algorithm Level Inherent Features Bahman ArastehSeyed Ghassem MiremadiAmir Masoud Rahmani OriginalPaper 25 February 2014 Pages: 193 - 212
Low Cost Signal Reconstruction Based Testing of RF Components using Incoherent Undersampling Debesh BhattaAritra BanerjeeAbhijit Chatterjee OriginalPaper 26 April 2014 Pages: 213 - 228
A Test Time Theorem and its Applications Praveen VenkataramaniSuraj SindiaVishwani D. Agrawal OriginalPaper 27 April 2014 Pages: 229 - 236
Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length Coding Haiying YuanJiaping MeiKun Guo OriginalPaper 23 April 2014 Pages: 237 - 242
Soft Fault Diagnosis of Analog Circuits via Frequency Response Function Measurements Yongle XieXifeng LiQizhong Zhou OriginalPaper 26 April 2014 Pages: 243 - 249