1. Editorial

   • Vishwani D. Agrawal

   Editorial Board Pages: 455 - 455

2. Test Technology Technical Council Newsletter

   News Pages: 457 - 458

3. Generation of Electrically Induced Stimuli for MEMS Self-Test

   • Benoît Charlot
   • Salvador Mir
   • Bernard Courtois

   OriginalPaper Pages: 459 - 470

4. Fault Diagnosis of Nonlinear Analog Circuits Using Neural Networks with Wavelet and Fourier Transforms as Preprocessors

   • Farzan Aminian
   • Mehran Aminian

   OriginalPaper Pages: 471 - 481

5. Fault Diagnosis for Linear Analog Circuits

   • Jun Weir Lin
   • Chung Len Lee
   • Jwu-E. Chen

   OriginalPaper Pages: 483 - 494

6. Fault Models and Test Procedures for Flash Memory Disturbances

   • Mohammad Gh. Mohammad
   • Kewal K. Saluja
   • Alex S. Yap

   OriginalPaper Pages: 495 - 508

7. Why is Combinational ATPG Efficiently Solvable for Practical VLSI Circuits?

   • Mukul R. Prasad
   • Philip Chong
   • Kurt Keutzer

   OriginalPaper Pages: 509 - 527

8. On Using Twisted-Ring Counters for Test Set Embedding in BIST

   • Shivakumar Swaminathan
   • Krishnendu Chakrabarty

   OriginalPaper Pages: 529 - 542

9. An Algebraic Approach to Formal Verification of Microprocessors

   • Kanji Hirabayashi

   OriginalPaper Pages: 543 - 544