On-Line Testing for VLSI—A Compendium of Approaches M. NicolaidisY. Zorian OriginalPaper Pages: 7 - 20
Efficient Totally Self-Checking Shifter Design Ricardo O. DuarteM. NicolaidisY. Zorian OriginalPaper Pages: 29 - 39
A New Design Method for Self-Checking Unidirectional Combinational Circuits V.V. SaposhnikovA. MorosovM. Gössel OriginalPaper Pages: 41 - 53
Concurrent Delay Testing in Totally Self-Checking Systems Antonis PaschalisDimitris GizopoulosNikolaos Gaitanis OriginalPaper Pages: 55 - 61
Design of Self-Testing Checkers for m-out-of-n Codes Using Parallel Counters Stanislaw J. Piestrak OriginalPaper Pages: 63 - 68
Thermal Monitoring of Self-Checking Systems V. SzékelyM. RenczB. Courtois OriginalPaper Pages: 81 - 92
Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronic Structures Karim ArabiBozena Kaminska OriginalPaper Pages: 93 - 99
Clocked Dosimeter Compatible with Digital CMOS Technology E. Garcia-MorenoB. IñiguezE. Isern OriginalPaper Pages: 101 - 110
Scalable Test Generators for High-Speed Datapath Circuits Hussain Al-AsaadJohn P. HayesBrian T. Murray OriginalPaper Pages: 111 - 125
Mixed-Mode BIST Using Embedded Processors Sybille HellebrandHans-Joachim WunderlichAndre Hertwig OriginalPaper Pages: 127 - 138
On-Line Fault Resilience Through Gracefully Degradable ASICs Alex Orailoğlu OriginalPaper Pages: 145 - 151
Delivering Dependable Telecommunication Services Using Off-the-Shelf System Components Y. Levendel OriginalPaper Pages: 153 - 159