The Role of Quantization Effects on the Operation of 50 nm MOSFETs, 250 nm FIBMOS Devices and Narrow-Width SOI Device Structures D. VasileskaI. KnezevicD.K. Ferry OriginalPaper Pages: 453 - 465
Study of Electron Transport in SOI MOSFETs Using Monte Carlo Technique with Full-Band Modeling H. TakedaN. MoriC. Hamaguchi OriginalPaper Pages: 467 - 474
Fullband Particle-Based Simulation of High-Field Transient Transport in III–V Semiconductors S. WiggerM. SaranitiA. Leitenstorfer OriginalPaper Pages: 475 - 480
The Use of Quantum Potentials for Confinement and Tunnelling in Semiconductor Devices A. AsenovJ.R. WatlingD.K. Ferry OriginalPaper Pages: 503 - 513