Abstract
Sulfur segregation was characterized by secondary ion mass spectrometry (SIMS) in uncoated single-crystal Ni-based AM1 superalloys with various S contents and on NiPtAl, NiAl and NiPt bondcoats of complete TBC systems. In spite of technical difficulties associated with diffuse sputtered interfaces, an original sample preparation technique and a careful choice of analysis conditions enabled a chemical characterization of S distribution below metal/oxide interfaces. An initial heterogeneous distribution of S in as-received high S (3.2 ppmw) AM1 was measured. After oxidation, a S depletion profile formed, with a slope that depended on the initial bulk S content. GDMS measurements enabled a quantitative distribution of S in oxidized low S (0.14 ppmw) AM1 to be constructed and discussed in relation to equilibrium surface segregation of S on Ni. The quantity of S integrated in the thermally grown oxide (TGO) was estimated and found to be very similar to that measured from depletion found in the metal. Localized S enrichments in Pt-containing coatings are related to a possible beneficial trapping mechanism of Pt on the adherence of oxide scales.
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Acknowledgments
The authors are grateful to Claude Armand and Françoise Voillot at the Institut National des Sciences Appliquées, Toulouse, France for conducting the SIMS analyses. The financial support of SNECMA-SAFRAN company is also acknowledged.
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Gheno, T., Monceau, D., Oquab, D. et al. Characterization of Sulfur Distribution in Ni-Based Superalloy and Thermal Barrier Coatings After High Temperature Oxidation: A SIMS Analysis. Oxid Met 73, 95–113 (2010). https://doi.org/10.1007/s11085-009-9164-z
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DOI: https://doi.org/10.1007/s11085-009-9164-z