Abstract
In the semiconductor industry at the end of the product process, manufacturers typically employ electrical tests to ensure that only high-quality products will be delivered to the customer. Furthermore, they use accelerating stress tests to investigate the reliability of their products. To improve the production process, failed devices are physically analyzed to clarify the reason for the failure.
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© 1996 Springer Science+Business Media New York
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Pfannschmidt, G. (1996). Characterization of Electronic Components by Acoustic Microscopy. In: Briggs, A., Arnold, W. (eds) Advances in Acoustic Microscopy. Advances in Acoustic Microscopy, vol 2. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-5851-4_1
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DOI: https://doi.org/10.1007/978-1-4615-5851-4_1
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