Abstract
Several advanced packaging and interconnection technologies are currently under development to meet the requirements of complex, large and/or high-speed microelectronic integrated circuits (IC) and systems. These include the design of multilayer interconnection substrates (see Fig. 1.1) for Multichip Module (MCM) applications(1) and the development of multilayer ceramic pin grid array packages (see Fig. 1.2) for large-area die size, high pin count ICs.(2) A development road map(3) for single-chip packaging technologies is presented in Fig. 1.3.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Reche, J. J. (1990). Fabrication of high-density multichip modules. IEEE Trans. Components Hybrids Manuf Technol. 13(3)565–69.
Chantraine, P., Chandler, N., Brandenburger, J., Chilo, J., de Maquillé Y., Ó Mathtina, S. C., Koschnick, W., Bargain, R., Dümcke, R. (1992). In: Proceedings Annual ESPRIT Conference, Commission of the European Communities, Brussels, Belgium, pp. 101–111.
Reichl, H. Packaging aspects of single-and multichip modules. Proceedings 1st European Conference on Electronic Packaging Technology (EuPac 1994), Essen, German Welding Society, Dusseldorf, Germany, Feb. 1994, pp. 6–9.
Briggs, G. A. D. (1992). Acoustic Microscopy, Oxford University Press, Oxford, UK.
Quate, C. F., Atalar, A., Wickramasinghe, H. L. (1979). Acoustic microscopy with mechanical scanning—a review. Proc.. IEEE 67, 1092–1114.
BRITE-EURAM Project no. 4398 (0000). Ceramic evaluation using microacoustic waves (C-MAW).
European Space Agency Contract MTSL 018 (Acoustic Microscopy)
Buda, L. R., Gedney, R. W., Kelley, T. F. (1992). High-density packaging: future outlook. Proceedings 42d Electronic Components and Technology Conference, San Diego, IEEE, New York, pp. 36–41.
Kelly, G., Lyden, C., Ó Mathúna, S. C., Barrett, J., Exposito, J., Pape, H. (1993). Development and use of numerical modelling tools for advanced packaging technologies—a European perspective. Presented at Annual Winter Meeting of ASME, New Orleans.
White, G. L. (1985). An introduction to die attach. Welding Institute Research Bulletin,pp. 268–271.
Mil-Std-883C Method-2030 (1987). Ultrasonic Inspection of Die Attach. Notice 5, US Dept. of Defense, Washington, DC.
Heinen, K. G., Schroen, W. H., Edwards, D. R., Wilson, A. M., Stierman, R. J., Lamson, M. A. (1989). Multichip assembly with flipped integrated curcuits. Proceedings Electronic Components Conference, IEEE, New York, pp. 672–80.
Packaging takes on a new dimension. European Semiconductor Production,21–22.
Groothius, S., Schroen, W., Murtuza, M. (1985). Computer-aided stress modelling for optimising plastic package reliability. 23d Annual Proc. IEEE International Reliability Physics Symposium, New York, pp. 184–91.
Ó Mathiúna, S. C., Fromont, T., Koschnick, W., O’Connor, L. (1993). Test Chips, Test Systems and Thermal Test Data for Multichip Modules in the ESPRIT-APACHIP Project, IEEE Transactions on Components, Packaging and Manufacturing Technology, Part A, 17(3). IEEE, New York, pp. 117–126.
Tummala, R. R., and Rymaszewski, E. J. (1989). Microelectronics Packaging Handbook,Van Nostrand Reinhold, New York.
Mil-Std-883C Method 1014.5 (1983). Seal. U.S. Dept. of Defense, Washington, DC.
Flannery, J., Crean, G. M., O’Mathuna, S. C. (1992). In: Acoustical Imaging, vol. 19, Plenum Press, New York, pp. 717–21.
Crean, G. M., Zhang, D., Flannery, J., and O’Mathuna, S. C. (1992). In: Proceedings 14th International Conference on Acoustics (Li Peizi, ed.), Beijing, pp. L5–1.
Nongaillard, B., Rouvaen, J. M., Logette, P., Bridoux, E., Torquet, R. (1986). Zooming lens for acoustic microscopy applications. J. Appl. Phys. 59, 3028–32.
Atalar, A. and Koymen, H. (1989). A high-efficiency Lamb wave lens for subsurface imaging. Proceedings IEEE Ultrasonics Symposium,IEEE, New York, pp. 813–16.
Zhang, D. and Crean, G. M. (1991). Shear wave imaging for deep nondestructive evaluation. Electr. Lett. 27(24), 2248–49.
Zhang, D. and Crean, G. M. (1992). Deep subsurface imaging using shear wave mode acoustic microscopy. Proceedings Institute of Physics (IOP) Conference on Developments in Acoustics and Ultrasonics (M. Povey and D. J. Clements, eds.), IOP Publishing, Bristol, UK, pp. 215–18.
Zhang, D. and Crean, G. M. (1992). Calculation of the focussed acoustic shear wave field in a ceramic substrate. Proceedings of the 14th International Conference on Acoustics (Li Peizi, ed.), Beijing, pp. L5–3.
Zhang, D. and Crean, G. M. (1993). Shear wave imaging using an annular lens. Appl. Phys. Lett. 62(3), 318–20.
IPC-SM-786 Standard (1991). Impact of moisture on plastic IC package cracking; and IPC-Test Method 650–2.6.20 (1991). Plastic surface mount component cracking. Institute for Interconnecting and Packaging Electronic Circuits (IPC), Lincolnwood, IL.
Moore, T. M. and Kelsall, S. J. (1992). The impact of delamination on stress-induced and contamination-related failure in surface mount ICs. Proceeding IEEE International Reliability Physics Symposium, IEEE, New York, pp. 169–76.
Van Doorselaer, K., Hente, A., Saboui, A., Moscicki, J. P. (1993). Thin type packaging: an effective way to improve the popcorn resistance of plastic-packaged ICs. Proceedings IEEE International Reliability Physics Symposium,IEEE, New York, pp. 244–49.
Moore, T. M. (1992). C-Mode acoustic microscopy applied to integrated-circuit-package inspection. Solid-State Electron. 35(3), 411–21.
Van Doorselaer, K., Moore, T. M., Tiziani, R., Baelde, W. (1992). Evaluation of methods for delamination detection by acoustic microscopy in plastic-packaged integrated circuits. Proceedings 18th International Symposium for Testing and Failure Analysis, ASM International, Ohio, pp. 425–31.
Shook, R. L. and Conrad, T. R. (1993). Accelerated life performance of moisture-damaged plastic surface mount devices. Proceedings IEEE International Reliability Physics Symposium, IEEE, New York, pp. 227–35.
van Gestel, R., de Zeeuw, K., van Gemert, L., Bagerman, E. (1992). Comparison of delamination effects between temperature-cycling test and highly accelerated stress test in plastic-packaged devices. Proceedings IEEE International Reliability Physics Symposium, IEEE, New York, pp. 177–81.
Brekhovskikh, L. M. (1980). Waves in Layered Media, 2d ed., Academic Press, New York.
Kelly, G., Lyden, C., O’Mathúna, S. C., Campbell, J. S. (1992). Investigation of thermomechanically induced stress in a PQFP 160 using finite element techniques. In: Proceedings 42d Electronic Components and Technology Conference (ECTC), IEEE, New York, pp. 467–72.
Mirasole, M. J. (1988). In: Proceedings of the International Symposium for Testing and Failure Analysis (ISTFA), ASM International, Materials Park, Ohio, pp. 77–88.
Kessler, L. W., Semmens, J. E., Agramonte, F. (1985). Nondestructive die attach bond evaluation comparing scanning laser acoustic microscopy (SLAM) and X-radiography. In: Proceedings of the Electronics Component Conference. IEEE, New York, pp. 250–58.
Semmens, J. E. and Kessler, L. W. (1991). Application of acoustic microimaging to the evaluation of multichip modules (MCM). In: Proceedings of the Technical Program of the Surftwe Mount International Conference, Surface Mount International, Edina, Minnesota, pp. 44–52.
Siettmann, J., Dias, R., Fiebelkorn, K. (1992). In: Proceedings of the International Reliability Physics Symposium, IEEE New York, pp. 309–14.
Flannery, J., and Crean, G. M. (1990). Scanning acoustic microscopy of multilayer interconnect structures. In: Proceedings Symposium International Society for Hybrid Microelecronics, ISHM, Reston, Virginia, pp. 358–63.
Zakel, E., Azdasht, G., Reichl, H. (1991). Investigations of laser-soldered TAB inner lead contacts. IEEE Trans. on Components, Hybrids, and Manufacturing Technology, 14(4), 672–79.
Teoh, H., McGeary, M., Ling, J. (1990). Laser/Infrared evaluation of TAB inner lead bond integrity. Proceedings Electronic Components and Technology Conference, IEEE, New York, pp. 442–49.
Semmens, J. E. and Kessler, L. W. (1990). Nondestructive evaluation of TAB outer lead bonding using acoustic microscopy. Proceedings International Society for Hybrid Microelectronics Symposium, ISHM, Reston, Virginia, pp. 644–51.
Scharr, T. A. and Nagarkar, M. D. (1989). Outer lead and die bond reliability in high-density TAB. Proceedings Electronics Components Conference,IEEE, New York, pp. 177–83.
Lau, J. H., Rice, D. W., Harkins, C. G. (1989). Thermal stress analysis of tape-automated bonding packages and interconnections. Proceedings Electronics Components Conference, IEEE New York, pp. 456–63.
Flannery, C. M., Crean, G. M., O’Mathuna, S. C. (1994). In: Proceedings of 1st European Conference on Electronic Packaging Technology (EuPac ‘94), Essen, Germany.
Zhang, D. and Crean, G. M. (1991). In: Proceedings Materials Research Society Symposium, vol. 239, Materials Research Society, Pittsburgh, pp. 281–86.
Segmulleller, A., and Murakami, M. (1988). In: Treatise on Materials Science and Engineering, vol. 27 (H. Herman, ed.), pp. 143–200. Academic Press, New York.
Pethica, J. B. and Oliver, W. C. (1990). In: Proceedings of the Materials Research Society Symposium, vol. 130, Materials Research Society, Pittsburgh, pp. 13–17.
Flinn, P. A. (1990). In: Proceedings of the Materials Research Society Symposium, vol. 130, Materials Research Society, Pittsburgh, pp. 41–51.
Crean, G. M., Golanski, A., Oberlin, J. C. (1989). Effective elastic constants of thin-film tungsten silicide from surface acoustic wave analysis. Appl. Phys. Lett. 50(2), 74–76.
Crean, G. M. (1990). In: Proceedings 14th Conference on Scanning Microscopy in Materials Testing, pp. 55–67. DVM, Berlin.
Flannery, C. M., Flaherty, T., Zhang, D., Cundill, R. T., Crean, G. M. (1993). In: Proceedings of the International Conference on Advanced Materials (ICAM), Symposium on Nondestructive Evaluation of Materials, Tokyo, Elsevier, Amsterdam.
Alper, T., Challis, R. E., Crean, G. M., Zhang, D. (1992). Longitudinal and shear ultrasonic velocities in AIN, Al2O3, and SIC ceramics. Proceedings Institute of Physics (IOP) Conference on Developments in Acoustics and Ultrasonics, pp. 209–214, (M. Povey and D. J. Clements, eds.) IOP Publishing, Bristol, UK.
Oishi, M., Noguchi, K., Murayama, K. (1990). Measurement of elastic constants of ceramics by a scanning laser acoustic microscope. JSME International Journal, Series 1 33(1), 96–100.
Mihara, T., and Obata, M. (1992). Elastic constant measurement using line-focus-beam acoustic microscope. Ever. Mech. 32(1), 30–33.
Rowe, J. M. (1987). Quantitative acoustic microscopy of surfaces. Ph.D. diss., Oxford University.
Flannery, C. M., Flaherty, T., Zhang, D., Cundill, R. T., Crean, G. M. (1994). In: Proceedings of 1st European Conference on Electronic Packaging Technology (EuPac ‘94), Essen, German Welding Society, Dusseldorf, Germany, pp. 160–164.
Flaherty, T., Lynch, S., Kelly, P. V., O’Keeffe, M., Cundill, R. T., Crean, G. M. (1993). In: Proceedings of the International Conference on Advanced Materials, Symposium on Fabrication of Silicon-Based Ceramics, Tokyo, Elsevier, Amsterdam.
Kubota, J., Okada, H., Musha, Y., Takishita, Y., Iwasaki, A., Saski, S. (1988). Electronic scanning of 25-MHz ultrasound for imaging IC packages. IEEE Ultrasonics Symposium, IEEE, New York, pp. 767–70.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1995 Springer Science+Business Media New York
About this chapter
Cite this chapter
Crean, G.M., Flannery, C.M., Ó Mathúna, S.C. (1995). Acoustic Microscopy Analysis of Microelectronic Interconnection and Packaging Technologies. In: Briggs, A. (eds) Advances in Acoustic Microscopy. Advances in Acoustic Microscopy, vol 1. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-1873-0_1
Download citation
DOI: https://doi.org/10.1007/978-1-4615-1873-0_1
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4613-5762-9
Online ISBN: 978-1-4615-1873-0
eBook Packages: Springer Book Archive