Overview
- First one in the emerging field of low dielectric constant materials
- There is worldwide a big need for such a book
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Advanced Microelectronics (MICROELECTR., volume 9)
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Table of contents (10 chapters)
Reviews
From the reviews:
Praise for P.S. Ho, J. Leu, and W.W. Lee, Ed's, Low Dielectric Constant Materials for IC Applications
Electrical Insulation Magazine
"Because this volume contains an excellent overview of the current research and issues with low-k dielectric materials for IC applications along with comprehensive practical information, researches, material scientists, and polymer engineers working in the area of microelectronics will find this book a very valuable addition to their library."
"This text addresses the latest advances in low-k materials, thin film characterization, integration into copper interconnection processing, and reliability for microelectronics applications. … Because this volume contains an excellent overview of the current research and issues with low-k dielectric materials for IC applications along with comprehensive practical information, researchers, material scientists, and polymer engineers working in the area of microelectronics will find this book a very valuable addition to their library." (IEEE Electrical Insulation Magazine, Vol. 20 (2), March/April, 2004)
"This book addresses issues on the development, characterization and integration of low dielectric constant (k) materials for advanced on-chip interconnects. … this book illustrates in a comprehensive way the technological challenges brought by the introduction of low-k materials into semiconductor manufacturing. … Being intended to researchers and engineers active in the field of semiconductor processing, it can be used as an introductory book … . Highly appreciated." (Jean - Francois de Marneffe, Physicalia, Vol. 25 (4), 2003)
Editors and Affiliations
Bibliographic Information
Book Title: Low Dielectric Constant Materials for IC Applications
Editors: Paul S. Ho, Jihperng Jim Leu, Wei William Lee
Series Title: Springer Series in Advanced Microelectronics
DOI: https://doi.org/10.1007/978-3-642-55908-2
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 2003
Hardcover ISBN: 978-3-540-67819-9Published: 14 November 2002
Softcover ISBN: 978-3-642-63221-1Published: 04 October 2012
eBook ISBN: 978-3-642-55908-2Published: 06 December 2012
Series ISSN: 1437-0387
Series E-ISSN: 2197-6643
Edition Number: 1
Number of Pages: XIX, 310
Topics: Electronics and Microelectronics, Instrumentation, Optical and Electronic Materials, Characterization and Evaluation of Materials