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About this book
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
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Keywords
Table of contents (15 chapters)
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Front Matter
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Introduction
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Back Matter
Editors and Affiliations
Bibliographic Information
Book Title: On-Line Testing for VLSI
Editors: Michael Nicolaidis, Yervan Zorian, Dhiraj K. Pradan
Series Title: Frontiers in Electronic Testing
DOI: https://doi.org/10.1007/978-1-4757-6069-9
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 1998
Hardcover ISBN: 978-0-7923-8132-7Published: 30 April 1998
Softcover ISBN: 978-1-4419-5033-8Published: 06 December 2010
eBook ISBN: 978-1-4757-6069-9Published: 09 March 2013
Series ISSN: 0929-1296
Edition Number: 1
Number of Pages: IV, 160
Topics: Electronics and Microelectronics, Instrumentation, Circuits and Systems, Electrical Engineering, Computer-Aided Engineering (CAD, CAE) and Design