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Thermal Monitoring of Self-Checking Systems

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On-Line Testing for VLSI

Part of the book series: Frontiers in Electronic Testing ((FRET,volume 11))

Abstract

With the increasing power density in integrated systems resulting from scaling down, the occurrence of field failures due to overheating has considerably increased. Faulty operation can be prevented by on-line temperature monitoring. This paper deals with questions of on-line temperature monitoring in safety-critical systems. First the possible temperature sensors are reviewed and basic principles of self-checking systems including such sensors are detailed, then a new temperature sensor cell with extremely good parameters designed especially for DfTT applications is presented. The basic questions of integrating thermal sensors into self-checking systems are also discussed.

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© 1998 Springer Science+Business Media New York

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Székely, V., Rencz, M., Karam, J.M., Lubaszewski, M., Courtois, B. (1998). Thermal Monitoring of Self-Checking Systems. In: Nicolaidis, M., Zorian, Y., Pradan, D.K. (eds) On-Line Testing for VLSI. Frontiers in Electronic Testing, vol 11. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-6069-9_8

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  • DOI: https://doi.org/10.1007/978-1-4757-6069-9_8

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4419-5033-8

  • Online ISBN: 978-1-4757-6069-9

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