Abstract
The concept of an inherent dimensional effect in depleted semiconductor layers (comparability of the characteristic scale of a depleted layer to an average distance between electrically active defects) is introduced. Inherent nonuniformities of an electric field and the potential at the semiconductor surface are determined for intrinsic and impurity surface states. The dependence of these nonuniformities on surface and bulk parameters is considered.
Similar content being viewed by others
References
I. S. Zhuguleva and V. P. Smilga, in Proceedings of the V Conference on Surface Forces (Nauka, Moscow, 1974), p. 220.
S. G. Dmitriev and Sh. M. Kogan, Fiz. Tverd. Tela (Leningrad) 21(1), 29 (1979) [Sov. Phys. Solid State 21, 17 (1979)].
D. Arnold and K. Hess, J. Appl. Phys. 61(11), 5178 (1987).
J. H. Davies and J. A. Nixon, Phys. Rev. B 39(5), 3423 (1989).
V. B. Bondarenko, Yu. A. Kudinov, S. G. Ershov, and V. V. Korablev, Fiz. Tekh. Poluprovodn. (St. Petersburg) 30(11), 2068 (1996) [Semiconductors 30, 1078 (1996)].
V. B. Bondarenko, Yu. A. Kudinov, S. G. Ershov, and V. V. Korablev, Fiz. Tekh. Poluprovodn. (St. Petersburg) 32(5), 554 (1998) [Semiconductors 32, 495 (1998)].
B. I. Shklovskii and A. L. Efros, Electronic Properties of Doped Semiconductors (Nauka, Moscow, 1979; Springer-Verlag, New York, 1984).
D. Hudson, Statistics. Lectures on Elementary Statistics and Probability (Geneva, 1964; Mir, Moscow, 1967), CERN Report.
L. D. Landau and E. M. Lifshitz, Course of Theoretical Physics, Vol. 8: Electrodynamics of Continuous Media (Nauka, Moscow, 1982; Pergamon, New York, 1984).
Author information
Authors and Affiliations
Additional information
__________
Translated from Fizika i Tekhnika Poluprovodnikov, Vol. 35, No. 8, 2001, pp. 964–968.
Original Russian Text Copyright © 2001 by Bondarenko, Kuz’min, Korablev.
Rights and permissions
About this article
Cite this article
Bondarenko, V.B., Kuz’min, M.V. & Korablev, V.V. Analysis of inherent potential nonuniformities at the extrinsic-semiconductor surface. Semiconductors 35, 927–931 (2001). https://doi.org/10.1134/1.1393029
Received:
Accepted:
Issue Date:
DOI: https://doi.org/10.1134/1.1393029