Abstract
The results of experiments on the formation of high-power pulses with a rise time of <1 ns and a duration of 1–2 ns by a solid-state semiconductor sharpener operating in the mode of delayed impact ionization wave are presented. A peak power of 1 GW in a single-pulse operation mode and 750 MW at a pulse repetition rate of 3.5 kHz was obtained across a 50-Ω load. Experiments on the pulse transformation using a forming line with a variable wave impedance and generation of bipolar voltage pulses are described.
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REFERENCES
Grekhov, I.V. and Kardo-Sysoev, A.F., Pis'ma Zh. Tekh. Fiz., 1979, vol. 5, no. 15, p. 950.
Grekhov, I.V., Kardo-Sysoev, A.F., Kostina, L.S., and Shenderei, S.V., Zh. Tekh. Fiz., 1981, vol. 51, no. 11, p. 1709.
Tuchkevich, V.M. and Grekhov, I.V., Novye printsipy kommutatsii bol'shikh moshchnostei poluprovodnikovymi priborami (New Principles of Switching High Powers by Semiconductor Devices), Leningrad: Nauka, 1988.
Grekhov, I.V., Solid-State Electron., 1989, vol. 32, no. 11, p. 923.
Lyubutin, S.K., Rukin, S.N., Slovikovskii, B.G., and Tsyranov, S.N., Prib. Tekh. Eksp., 2000, no. 3, p. 52.
Lyubutin, S.K., Mesyats, G.A., Rukin, S.N., and Slovikovskii, B.G., Dokl. Akad. Nauk, 1998, vol. 360, no. 4, p. 477.
Kremnev, V.V. and Mesyats, G.A., Metody umnozheniya i transformatsii impul'sov v sil'notochnoi elektronike (Methods of Pulse Multiplication and Transformation in Heavy-Current Electronics), Novosibirsk: Nauka, 1987.
Yalandin, M.I. and Shpak, V.G., Prib. Tekh. Eksp., 2001, no. 3, p. 5.
Lyubutin, S.K., Mesyats, G.A., Rukin, S.N., et al., Prib. Tekh. Eksp., 2001, no. 5, p. 80.
Andreev, Yu.A., Buyanov, Yu.I., Vizir', V.A., et al., Prib. Tekh. Eksp., 2000, no. 2, p. 82.
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Alichkin, E.A., Lyubutin, S.K., Ponomarev, A.V. et al. Formation of Short Pulses with a Subnanosecond Rise Time and a Peak Power of Up to 1 GW by a Semiconductor Avalanche Sharpener. Instruments and Experimental Techniques 45, 535–539 (2002). https://doi.org/10.1023/A:1019798805905
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DOI: https://doi.org/10.1023/A:1019798805905