Abstract
Low-temperature solders have wide applications in integrated circuits and micro-electromechanical systems packaging. In this article, a study on Ag-In solder for chip-to-chip thermocompression bonding was carried out. The resulting joint consists of AgIn2 and Ag9In4 phases, with the latter phase having a melting temperature higher than 400°C. Complete consumption of In solder into a Ag-rich intermetallic compound is achieved by applying a bond pressure of 1.4 MPa at 180°C for 40 min. We also observe that the bonding pressure effect enables a Ag-rich phase to be formed within a shorter bonding duration (10 min) at a higher pressure of 1.6 MPa. Finally, prolonged aging leads to the formation of the final phase of Ag9In4 in the bonded joints.
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Acknowledgements
The authors would like to acknowledge the School of Materials Science and Engineering at Nanyang Technological University (NTU), Singapore, for providing a scholarship to Riko I Made. The authors would also like to thank the Institute of Materials Research Engineering (IMRE), Agency for Science, Technology and Research (A*STAR), Singapore, for assistance with the Bruker-General Area Detector Diffraction System (GADDS). Chengkuo Lee, PI of IME Core Project 06-420004, would like to thank the Institute of Microelectronics, Agency for Science, Technology and Research (A*STAR), Singapore, for providing research funding for this research.
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Made, R.I., Gan, C.L., Yan, L.L. et al. Study of Low-Temperature Thermocompression Bonding in Ag-In Solder for Packaging Applications. J. Electron. Mater. 38, 365–371 (2009). https://doi.org/10.1007/s11664-008-0555-8
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DOI: https://doi.org/10.1007/s11664-008-0555-8