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Tolerating Soft Errors with Horizontal-Vertical-Diagonal-N-Queen (HVDNQ) Parity

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Abstract

A new error detection and correction methodology, defined as Horizontal-Vertical-Diagonal-N-Queen-Parity (HVDNQ), is proposed in this paper. This approach relies on five different types of parities: horizontal parity, vertical parity, forward diagonal parity, backward diagonal parity, and queen parity. This method works on an N X N cell area and can correct multi-bit upsets. The experimental analysis validates the effectiveness of the proposed methodology by comparing its efficiency with existing methodologies. In different varieties of error patterns such as equilateral triangle, pentagon, hexagon etc., the capability of error detection and correction of HVDNQ is much better than existing methods.

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Authors and Affiliations

  1. Khulna University of Engineering & Technology, Khulna, Bangladesh

    Muhammad Sheikh Sadi, Sumaiya Sumaiya, Mouly Dewan & Atikur Rahman

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  1. Muhammad Sheikh Sadi
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  2. Sumaiya Sumaiya
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  3. Mouly Dewan
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  4. Atikur Rahman
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Correspondence to Muhammad Sheikh Sadi.

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Responsible Editor: F. L. Vargas

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Sadi, M., Sumaiya, S., Dewan, M. et al. Tolerating Soft Errors with Horizontal-Vertical-Diagonal-N-Queen (HVDNQ) Parity. J Electron Test 37, 243–254 (2021). https://doi.org/10.1007/s10836-021-05942-4

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  • DOI: https://doi.org/10.1007/s10836-021-05942-4

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