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Radiation-induced defects in thin Cu(In,Ga)Se2 films on exposure to high-energy electron irradiation

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Abstract

At 4.2 K, the photoluminescence spectra of Cu(In,Ga)Se2 films irradiated by electrons with an energy of 5 MeV displayed the 0.93-and 0.79-eV bands that owe their origin to the radiative recombination of nonequilibrium charge carriers on radiation-induced defects. The position of the energy levels of the defects is determined and their nature is discussed.

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Correspondence to A. V. Mudryi.

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Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 72, No. 6, pp. 805–808, November–December, 2005.

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Mudryi, A.V., Gremenok, V.F., Ivanyukovich, A.V. et al. Radiation-induced defects in thin Cu(In,Ga)Se2 films on exposure to high-energy electron irradiation. J Appl Spectrosc 72, 883–886 (2005). https://doi.org/10.1007/s10812-006-0020-5

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  • DOI: https://doi.org/10.1007/s10812-006-0020-5

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