Abstract
Spectroscopic ellipsometry measurements are performed on thin pentacene films grown on glass, SiO2, and n-Si substrates. The Gauss–Lorentz oscillator model is shown to be effective in modeling the π–π ∗ transitions found in organic compounds. The effective medium approximation that considers the surface roughness of the films, which can be significant in case of pentacene, is also shown to be a key factor in precisely determining their dielectric functions. The proposed method reveals that there are some quantitative differences in the optical properties of the pentacene films prepared on different substrates.
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Han, SH., Yoo, S., Kippelen, B. et al. Precise determination of optical properties of pentacene thin films grown on various substrates: Gauss–Lorentz model with effective medium approach. Appl. Phys. B 104, 139–144 (2011). https://doi.org/10.1007/s00340-011-4383-9
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DOI: https://doi.org/10.1007/s00340-011-4383-9