Abstract
Key message
Fifteen and eleven loci, with most loci being novel, were identified to associate with seedling and adult resistances, respectively, to the durum-specific races of leaf rust pathogen in cultivated emmer.
Abstract
Leaf rust, caused by Puccinia triticina (Pt), constantly threatens durum (Triticum turgidum ssp. durum) and bread wheat (Triticum aestivum) production worldwide. A Pt race BBBQD detected in California in 2009 poses a potential threat to durum production in North America because resistance source to this race is rare in durum germplasm. To find new resistance sources, we assessed a panel of 180 cultivated emmer wheat (Triticum turgidum ssp. dicoccum) accessions for seedling resistance to BBBQD and for adult resistance to a mixture of durum-specific races BBBQJ, CCMSS, and MCDSS in the field, and genotyped the panel using genotype-by-sequencing (GBS) and the 9 K SNP (Single Nucleotide Polymorphism) Infinium array. The results showed 24 and nine accessions consistently exhibited seedling and adult resistance, respectively, with two accessions providing resistance at both stages. We performed genome-wide association studies using 46,383 GBS and 4,331 9 K SNP markers and identified 15 quantitative trait loci (QTL) for seedling resistance located mostly on chromosomes 2B and 6B, and 11 QTL for adult resistance on 2B, 3B and 6A. Of these QTL, one might be associated with leaf rust resistance (Lr) gene Lr53, and two with the QTL previously reported in durum or hexaploid wheat. The remaining QTL are potentially associated with new Lr genes. Further linkage analysis and gene cloning are necessary to identify the causal genes underlying these QTL. The emmer accessions with high levels of resistance will be useful for developing mapping populations and adapted durum germplasm and varieties with resistance to the durum-specific races.
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All data generated or analyzed during this study are included in this published article and its supplementary information files.
Change history
23 March 2023
A Correction to this paper has been published: https://doi.org/10.1007/s00122-023-04323-z
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Funding
We thank the Shiaoman Chao and Mary Osenga at USDA-ARS Small Grains Genotyping Laboratory at Fargo, ND for genotyping the emmer wheat panel using the wheat 9 K SNP iSelect assay. This research was supported in part by the USDA-ARS CRIS Project No. 3060-21000-038-00D and 2030-21430-014-00D, Non-Assistance Cooperative Agreement No. 58-3060-9-031, and an appointment to the Agricultural Research Service (ARS) Research Participation Program administered by the Oak Ridge Institute for Science and Education (ORISE) through an interagency agreement between the United States Department of Energy (DOE) and the United States Department of Agriculture (USDA). ORISE is managed by Oak Ridge Associated Universities (ORAU) under DOE contract number DE-SC0014664. QS was partially supported by China Scholarship Council. Mention of trade names or commercial products in this article is solely for the purpose of providing specific information and does not imply recommendation or endorsement by the U.S. Department of Agriculture.
All opinions expressed in this paper are the author's and do not necessarily reflect the policies and views of USDA, ARS, USDA is an equal opportunity provider and employer.
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SX and MA conceived and initiated the project. QZ prepared and increased seed stocks of the emmer panel. QS and MA performed the phenotype analysis and XL and JF (Fiedler) genotyped the emmer panel with the GBS method. QS conducted preliminary analysis for dissertation research advised by SX, XC, JF (Faris) and GX and assisted in manuscript preparation. DL performed all the data and bioinformatic analyses and wrote the manuscript assisted with SX and YG. UG and MA performed gene postulations. All authors reviewed and revised the manuscript.
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Lhamo, D., Sun, Q., Zhang, Q. et al. Genome-wide association analyses of leaf rust resistance in cultivated emmer wheat. Theor Appl Genet 136, 20 (2023). https://doi.org/10.1007/s00122-023-04281-6
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DOI: https://doi.org/10.1007/s00122-023-04281-6