Skip to main content
Log in

Effects of strain ratio and tensile hold time on low-cycle fatigue of lead-free Sn-3.5Ag-0.5Cu solder

  • Published:
Journal of Electronic Materials Aims and scope Submit manuscript

Abstract

Low-cycle fatigue (LCF) behavior of a lead-free Sn-3.5Ag-0.5Cu solder alloy was investigated at various combinations of strain ratio (R = −1, 0, and 0.5) and tensile hold time (0, 10, and 100 sec). Results showed that the LCF life of the given solder, at each given combination of testing conditions, could be individually described by a Coffin-Manson relationship. An increase of strain ratio from R=−1 to 0 and to 0.5 would cause a significant reduction of LCF life due to a mean strain effect instead of mean stress effect. LCF life was also markedly reduced when the hold time at tensile peak strain was increased from 0 to 100 sec, as a result of additional creep damage generated during LCF loading. With consideration of the effects of strain ratio and tensile hold time, a unified LCF lifetime model was proposed and did an excellent job in describing the LCF lives for all given testing conditions.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. M. McCormack and S. Jin,J. Electron. Mater. 23, 635 (1994).

    Article  CAS  Google Scholar 

  2. M. Abtew and G. Selvaduray,Mater. Sci. Eng. R 27, 95 (2000).

    Article  Google Scholar 

  3. D.P. Napp,SAMPE J. 32, 59 (1996).

    CAS  Google Scholar 

  4. W.J. Plumbridge,J. Mater. Sci. 31, 2501 (1996).

    Article  CAS  Google Scholar 

  5. M. Ohring,Reliability and Failure of Electronic Material and Devices (San Diego: Academic Press, 1998), pp. 492–526.

    Google Scholar 

  6. J.H. Lau,Solder Joint Reliability: Theory and Applications (New York: Van Nostrand Reinhold, 1991).

    Google Scholar 

  7. Y. Kariya and M. Otsuka,J. Electron. Mater. 27, 866 (1998).

    Article  CAS  Google Scholar 

  8. Y. Kariya and M. Otsuka,J. Electron. Mater. 27, 1229 (1998).

    Article  CAS  Google Scholar 

  9. Y. Kariya, T. Morihata, E. Hazawa, and M. Otsuka,J. Electron. Mater. 30, 1184 (2001).

    Article  CAS  Google Scholar 

  10. C. Kanchanomai, S. Yamamoto, Y. Miyashita, Y. Mutoh, and A.J. McEvily,Int. J. Fatigue 24, 57 (2002).

    Article  CAS  Google Scholar 

  11. C. Kanchanomai, Y. Miyashita, and Y. Mutoh,J. Electron. Mater. 31, 142 (2002).

    Article  CAS  Google Scholar 

  12. C. Kanchanomai, Y. Miyashita, Y. Mutoh, and S.L. Mannan,Mater. Sci. Eng. A 345, 90 (2003).

    Article  Google Scholar 

  13. C. Kanchanomai and Y. Mutoh,Mater. Sci. Eng. A 381, 113 (2004).

    Article  Google Scholar 

  14. C. Kanchanomai and Y. Mutoh,J. Electron. Mater. 33, 329 (2004).

    Article  CAS  Google Scholar 

  15. M.R. Harrison, J.H. Vincent, and H.A.H. Steen,Soldering Surf. Mount Technol. 13, 21 (2001).

    Article  CAS  Google Scholar 

  16. I.E. Anderson, B.A. Cook, J. Harringa, and R.L. Terpstra,J. Electron. Mater. 31, 1166 (2002).

    Article  CAS  Google Scholar 

  17. C.-K. Lin and D.-Y. Chu,J. Mater. Sci.: Mater. Electron. 16, 355 (2005).

    Article  CAS  Google Scholar 

  18. C. Kanchanomai, Y. Miyashita, and Y. Mutoh,J. Electron. Mater. 31, 456 (2002).

    Article  CAS  Google Scholar 

  19. J.H.L. Pang, B.S. Xiong, and T.H. Low,Thin Solid Films 462–463, 408 (2004).

    Article  Google Scholar 

  20. K.J. Lau, C.Y. Tang, P.C. Tse, C.L. Chow, S.P. Ng, C.P. Tsui, and B. Rao,Int. J. Fract. 130, 617 (2004).

    Article  CAS  Google Scholar 

  21. C. Anderson, Z. Lai, J. Liu, H. Jiang, and Y. Yu,Mater. Sci. Eng. A 394, 20 (2005).

    Article  Google Scholar 

  22. P.-L. Wu, M.-K. Huang, C. Lee, and S.-R. Tzan,Mater. Chem. Phys. 87, 285 (2004).

    Article  CAS  Google Scholar 

  23. X. Deng, R.S. Sidhu, P. Johnson, and N. Chawla,Metall. Mater. Trans. A 36A, 55 (2005).

    Article  CAS  Google Scholar 

  24. W.W. Lee, L.T. Nguyen, and G.S. Selvaduray,Microelectron. Reliab. 40, 231 (2000).

    Article  Google Scholar 

  25. M.E. Loomans and M.E. Fine,Metall. Mater. Trans. A 31A, 1155 (2000).

    Article  CAS  Google Scholar 

  26. K.W. Moon, W.J. Boettinger, U.R. Kattner, F.S. Biancaniello, and C.A. Handwerker,J. Electron. Mater. 29, 1122 (2000).

    Article  CAS  Google Scholar 

  27. S.L. Mannan,Bull. Mater. Sci. 16, 561 (1993).

    CAS  Google Scholar 

  28. R.E. Read-Hill and R. Abbaschian,Physical Metallurgy Principles, 3rd ed. (Boston: PWS Publishing Company, 1994), pp. 294–298.

    Google Scholar 

  29. L.F. Coffin, Jr.,Trans. ASME 76, 931 (1954).

    CAS  Google Scholar 

  30. S.S. Manson,Heat Transfer Symposium (Ann Arbor: University of Michigan Engineering Research Institute, 1953), pp. 9–75.

    Google Scholar 

  31. W. Schutz,Fatigue Life Prediction for Aircraft Structure and Materials, NATO AGARD-LS-62 (Geneva: NATO, 1973), pp. 10-1–10-32.

    Google Scholar 

  32. C.-K. Lin and Y.-L. Pai,Int. J. Fatigue 21, 45 (1999).

    Article  CAS  Google Scholar 

  33. J.A. Collins,Failure of Materials in Mechanical Design: Analysis, Prediction, Prevention, 2nd ed. (New York: John Wiley & Sons, Inc., 1993), pp. 401–404.

    Google Scholar 

  34. J.K. Tien, S.V. Nair, and V.C. Nardone,Flow and Fracture at Elevated Temperatures, ed. R. Raj (Philadelphia: Carnes Publication Services, 1983), pp. 179–213.

    Google Scholar 

  35. C. Gandhi,Flow and Fracture at Elevated Temperatures, ed. R. Raj (Philadelphia: Carnes Publication Services, 1983), pp. 83–119.

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

About this article

Cite this article

Lin, CK., Huang, CM. Effects of strain ratio and tensile hold time on low-cycle fatigue of lead-free Sn-3.5Ag-0.5Cu solder. J. Electron. Mater. 35, 292–301 (2006). https://doi.org/10.1007/BF02692449

Download citation

  • Received:

  • Accepted:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF02692449

Key words

Navigation