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Effect of bonding time on the microstructure and shear property of Cu/SAC-15Ag/Cu 3D package solder joint fabricated by TLP

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Abstract

In this paper, Cu/SAC-15Ag/Cu 3D package solder joints were prepared by transient liquid phase (TLP) bonding technology. The effects of bonding time on the microstructure and shear property of solder joints were investigated. The results indicated that the microstructure of solder joints is coarsened with increasing bonding time. The intermetallic compounds (IMCs) in the interfacial reaction zone consist of Cu3Sn and Cu6Sn5 phase, and the IMCs in the in situ reaction zone include Ag3Sn phase, Sn-rich phase, and Ag particles. The thickness of interfacial IMCs layer initially decreases due to the volume contraction caused by the transformation from Cu6Sn5 to Cu3Sn, and then increases as a result of the coarsen of Cu3Sn. The minimum porosity of the solder joints reaches 0.24% under bonding time of 30 min. The shear strength of solder joints increases first and then declines with the extension of bonding time, and the maximum shear strength of 45.3 MPa is obtained by bonding for 30 min. The shear fracture mechanism of solder joints changes from ductile fracture to ductile–brittle mixed fracture, and then changes to brittle fracture. Cracks nucleate at the voids and propagate quickly with prolonging bonding time, and the cracks could be restrained by the voids.

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References

  1. L.A. Navarro, X. Perpina, P. Godignon, J. Montserrat, V. Banu, M. Vellvehi, X. Jorda, I.E.E.E.T. Power, Electr. 29, 2261 (2014)

    Google Scholar 

  2. W. Zhou, X. Zhong, K. Sheng, I.E.E.E.T. Power, Electr. 29, 2329 (2014)

    Google Scholar 

  3. R. Wang, D. Boroyevich, P. Ning, Z. Wang, F. Wang, P. Mattavelli, K.D.T. Ngo, K. Rajashekara, I.E.E.E.T. Power, Electr. 28, 555 (2013)

    Google Scholar 

  4. J.F. Li, P.A. Agyakwa and C.M, Acta Mater. 59, 1198 (2011)

  5. H. Shao, A. Wu, Y. Bao, Y. Zhao, L. Liu, G. Zou, Ultrason. Sonochem. 37, 561 (2017)

    Article  CAS  Google Scholar 

  6. H. Shao, A. Wu, Y. Bao, Y. Zhao, G. Zou, Mat. Sci. Eng. A-Struct. 680, 221 (2017)

    Article  CAS  Google Scholar 

  7. H. Shao, A. Wu, Y. Bao, Y. Zhao, G. Zou, T. Nonferr, Metal. Soc. 27, 722 (2017)

    CAS  Google Scholar 

  8. H. Liu, K. Wang, K.E. Aasmundtveit, N. Hoivik, J. Electron. Mater. 41, 2453 (2012)

    Article  CAS  Google Scholar 

  9. C. Hang, Y. Tian, R. Zhang, D. Yang, J. Mater. Sci-Mater. El. 24, 3905 (2013)

    Article  CAS  Google Scholar 

  10. H. Shao, A. Wu, Y. Bao, Y. Zhao, J. Mater. Sci. 52, 3508 (2017)

    Article  CAS  Google Scholar 

  11. K. Chu, Y. Sohn, C. Moon, Scripta. Mater. 109, 113 (2015)

    Article  CAS  Google Scholar 

  12. N.S. Bosco, F.W. Zok, Acta Mater. 53, 2019 (2005)

    Article  CAS  Google Scholar 

  13. X. Liu, S. He, H. Nishikawa, Scripta. Mater. 110, 101 (2016)

    Article  CAS  Google Scholar 

  14. B. Liu, Y. Tian, J. Feng, C. Wang, J. Mater. Sci. 52, 1943 (2017)

    Article  CAS  Google Scholar 

  15. M. He, F. Wu, W. Zhang, Y. Wu, B. An, Electronic quality. 08, 25 (2006)

    Google Scholar 

  16. L. Yang, J. Ge, Y. Zhang, J. Dai, Y. Jing, J. Mater. Sci-Mater. El. 26, 613 (2015)

    Article  Google Scholar 

  17. L. Sun, M. Chen, L. Zhang, F. Yang, Acta metalica Sinica. 53, 615 (2017)

    CAS  Google Scholar 

  18. F. Wang, L. Zhou, X. Wang, P. He, J. Alloy. Compd. 688, 639 (2016)

    Article  CAS  Google Scholar 

  19. Q.K. Zhang, Z.F. Zhang, Mater. Sci. Eng. A-Struct. 530, 452 (2011)

    Article  CAS  Google Scholar 

  20. F. Li, X. Li, Y. Yan, Fail. Anal. Prev. 1, 23 (2008)

    Google Scholar 

  21. L. Yang, L. Zhu, Y. Zhang, S. Zhou, Y. Xiong, P. Wu, Mater. Res. Express. 5, 1 (2018)

    Google Scholar 

  22. H.P.R. Frederikse, R.J. Fields, A. Feldman, J. Appl. Phys. 72, 2879 (1992)

    Article  CAS  Google Scholar 

  23. K.N. Tu, U. Gösele, Appl. Phys. Lett. 86, 093111 (2005)

    Article  Google Scholar 

  24. Y. Bao, A. Wu, H. Shao, J. Mater. Sci-Mater. El 29, 10246 (2018)

    Article  CAS  Google Scholar 

  25. A. Paul, C. Ghosh, W.J. Boettinger, Metall. Mater. Trans. A. 42, 952 (2011)

    Article  CAS  Google Scholar 

  26. M.J.M. Hermans, M.H. Biglari, The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects (Verlag London Limited, Springer, 2011), pp. 105–122

    Book  Google Scholar 

  27. H. Sun, Q. Li, Y.C. Chan, J. Mater, Sci-Mater. El. 25, 4380 (2014)

    Article  CAS  Google Scholar 

  28. P. Liu, P. Yao, J. Liu, J. Alloy. Compd. 486, 474 (2009)

    Article  CAS  Google Scholar 

  29. C. Yu, Y. Yang, K. Wang, J. Xu, J. Chen, H. Lu, J. Mater. Sci-Mater. El. 23, 124 (2012)

    Article  CAS  Google Scholar 

  30. H.T. Lee, M.H. Chen, H.M. Jao, T.L. Liao, Mat. Sci. Eng. A-Struct. 358, 134 (2003)

    Article  Google Scholar 

  31. J. Lau, S. Erasmus and S. Pan, in 52nd Electronic Components and Technology Conference (2002), pp. 992–1000

Download references

Acknowledgements

This work is supported by the National Natural Science Foundation of China (Grant No. 51865006), Natural Science Foundation of the Jiangsu Higher Education Institutions of China (Grant Nos. 19KJA430001 and 18KJA460001), and Guangxi Natural Science Foundation Project (Grant No. 2020GXNSFAA297004).

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Correspondence to Li Yang.

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Yang, L., Xu, Y., Zhang, Y. et al. Effect of bonding time on the microstructure and shear property of Cu/SAC-15Ag/Cu 3D package solder joint fabricated by TLP. J Mater Sci: Mater Electron 32, 8387–8395 (2021). https://doi.org/10.1007/s10854-021-05434-3

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