Abstract
Substantial consideration is being devoted to the innovation of AC Conductivity, sheet resistance measurements and Microhardness as a function of Cu interlayer thickness of conductive ZnO/Cu/ZnO thin films. ZnO layer was successfully prepared via atomic layer deposition (ALD), while Cu interlayer was deposited by Dc magnetron sputtering. The combination of ZnO/Cu/ZnO with constant ZnO thickness (70 nm) and variable Cu interlayer thickness (20, 50 and 70 nm), has its own individuality in enhancing the performance of the electrical and mechanical properties. The proposed methodology based on the previously published data of the structural characterization, proved to be very effective. The study of (XRD) and (SEM) revealed an increase in particle size with the increase in Cu content. The outcome of the absorption measurements supports the existence of allowed direct transition for ZnO/Cu/ZnO thin films, and the optical energy gap is strongly dependent on the amount of Cu interlayer thickness. The AC conductivity is explored in the frequency range of (1 MHz–1 GHz) and the temperature range of (293 to 423 K). At different frequencies AC conductivity measurements demonstrate a decrement with the increment of Cu content. An agreement between experimental and theoretical results suggests that the behavior of AC conductivity can be successfully explained by Correlated Barrier Hopping (CBH) model, to elucidate the conduction mechanism existing in our ZnO/Cu/ZnO system. A superior combination between mechanical and electrical properties was evaluated by Vickers hardness and the 4-point technique. The obtained results demonstrate that the layer thickness and the layer thickness ratio of ZnO and Cu are the important parameters which are responsible for the improvement of structural, electrical and mechanical properties of ZnO/Cu/ZnO multilayer films. These findings pave the way for the future development of novel energy devices and photocatalytic and absorption applications.
Similar content being viewed by others
Data availability
All data generated or analyzed during this study are included in this published article.
References
Li W-Y, Jiang L-X, Yin G-L, Wang Y-Y, Zhen Yu, He D-N (2013) Preparation and characterization of ZnO/Cu/ZnO transparent conductive films. Rare Met 32(3):273–277
Lonescu ML, Bensebaa F, Luan BL (2012) ZnO/Cu/ZnO multilayers deposited on flexible substrate. Thin Solid Films 525:162–166
Vidyasagar CC, Hosamani G, Kariyajjanavar P (2019) Optical and electrical properties of Cu-ZnO prism shape nanocrystals by microwave combustion method. Am J Energy Res 7(1):31–40
Hanaa Z, Parditka B, Erdélyi Z, Atyia HE, Sharma P, Fouad SS (2020) Investigation of dispersion parameters, dielectric properties and opto–electrical parameters of ZnO thin film grown by ALD. Optik 203:163933
Zayed H, Sayed ME, Elokr MM, Soliman LI (2018) Synthesis and characterization of Li2O modified sodium phosphate glasses. J Sci Res Sci 35(1):417–438
Licurgo JSC, de Almeida Neto GR, Paes Junior HR (2020) Structural, electrical and optical properties of copper-doped zinc oxide films deposited by spray pyrolysis. Ceramica 88:284–290
Fouad SS, Baradács E, Nabil M, Parditka B, Negm S, Erdélyi Z (2022) Microstructural and optical duality of TiO2/Cu/TiO2 trilayer films grown by atomic layer deposition and DC magnetron sputtering. Inorg Chem Commun 145:110017
Mehta N, Fouad SS, Baradacs E, Parditka B, Atyia HE, Pal SK, Erdelyi Z (2023) Multilayer stack structural designing of titania and Zinc white using atomic layer deposition (ALD) technique and study of thermally governed dielectric dispersion and conduction under alternating electric fields. J Mater Sci Mater Electron 34:708
Hanaa Z, Fouad SS, Parditka B, Bekheet AE, Atyia HE, Medhat M, Erdélyi Z (2020) Enhancement of dispersion optical parameters of Al2O3/ZnO thin films fabricated by ALD. Sol Energy 205:79–87
Fouad SS, Parditka B, Bekheet AE, Atyia HE, Erdélyi Z (2021) ALD of TiO2/ZnO mutilayers towards the understanding of optical properties and polarizability.". Opt Laser Technol 140:107035
Fouad SS, Bence Parditka HE, Atyia EB, Erdélyi Z (2022) The real role of Cu metallic interlayer on the dielectric dispersion and conduction mechanism of TiO2/Cu/TiO2 nanolaminates. Optik 260:169078
Fouad SS, Parditka B, Nabil M, Baradács E, Negm S, Atyia HE, Erdélyi Z (2021) Bilayer number driven changes in polarizability and optical property in ZnO/TiO2 nanocomposite films prepared by ALD. Optik 233:166617
Fouad SS, Parditka B, Atyia HE, Baradács E, Bekheet AE, Erdélyi Z (2022) AC conductivity and dielectric parameters studies in multilayer TiO2/ZnO thin films produced via ALD technique. Chin J Phys 77:73–80
Modwi A, Taha KK, Khezami L, Boudina M, Khairy M, Al-Duaij OK, Talab S (2021) “ Dependence of the electrical properties of Cu-doped ZnO nanoparticles decorated by Ag atoms. Z Phys Chem 235(6):745–767
Fouad SS, Bence Parditka M, Nabil EB, Negm S, Erdélyi Z (2022) Effect of Cu interlayer on opto-electrical parameters of ZnO thin films. J Mater Sci Mater Electron 33:20594–20603
Choudhary S, Sengwa RJ (2017) Morphological, structural, dielectric and electrical properties of PEO–ZnO nanodielectric films. J Polym Res 24(3):1–12
Das HS, Gourisankar R, Kumar P, Das R (2021) Study the Effect of ZnO/Cu/ZnO multilayer structure by RF magnetron sputtering for flexible display applications.". ES Energy Environ 13:50–56
Haga K, Kamidaira M, Kashiwaba Y, Sekiguchi T, Watanabe H (2000) ZnO thin films prepared by remote plasma-enhanced CVD method. J Cryst Growth 214:77–80
Cruz-Gandarilla F, Morales-Acevedo A, Vigil O, Hesiquio-Garduno M, Vaillant L, Contreras-Puente G (2003) Micro-structural characterization of annealed cadmium–zinc oxide thin films obtained by spray pyrolysis. Mater Chem Phys 78(3):840–846
Jimenez-Gonzalez AE, Urueta JAS, Suarez-Parra R (1998) Optical and electrical characteristics of aluminum-doped ZnO thin films prepared by solgel technique. J Cryst Growth 192(3–4):430–438
Zhu BL, Sun XH, Zhao XZ, Su FH, Li GH, Wu XG, Wu J, Wu R, Liu J (2008) The effects of substrate temperature on the structure and properties of ZnO films prepared by pulsed laser deposition. Vacuum 82(5):495–500
Sahu DR, Huang J-L (2006) High quality transparent conductive ZnO/Ag/ZnO multilayer films deposited at room temperature. Thin Solid Films 515(3):876–879
Bonse J, Wrobel JM, Kautek W (2000) Appl Phys A Mater Sci Process 72:89–94
Graça MPF, Valente MA, da Ferreira-Silva MG (2003) Electrical properties of lithium niobium silicate glasses. J Noncryst Solids 325(1–3):267–274
Ganaie M, Zulfequar M (2015) Study of density of localized states in Cd4Se96−xSx (x= 0, 4, 8, 12) chalcogenide semiconductor. J Phys Chem Solids 85:51–55
Wei J, Kobayashi A (2005) Research of TiN coatings by means of gas tunnel type plasma reactive spraying. Novel materials processing by advanced electromagnetic energy sources. Elsevier, New York, pp 427–432
Mikla VI, Mikla VV (2011) Amorphous chalcogenides: the past present and future. Elsevier, New York
Angell CA (1992) Mobile ions in amorphous solids. Ann Rev Phys Chem 43(1):693–717
Sharma A, Mehta N, Kumar A (2011) Dependence of activation energy and pre-exponential factor on audio frequency in glassy Se80−xTe20Snx alloys. J Alloys Compd 509(8):3468–3472
Sanon G, Rup R, Mansingh A (1990) Growth and characterization of tin oxide films prepared by chemical vapour deposition. Thin Solid Films 190(2):287–301
Sawamera S, Wondraczek L (2018) Phys Rev Mater 2:1–5
Grabco DZ, Shikimaka OA, Elisa M, Sava BA, Bonroica L, Pyrtsak K, Prisacaru A, Danitsa Z, Feraru I, Ursu D (2012) Surf Eng Appl Eectrochem 48(4):365–374
Miah MJ, Hossain AKM (2016) Magnetic, dielectric and complex impedance properties of XBa0.95.SR0.05.TiO3—(1–x) BiFe0.9Gd0.1O3 multiferroic ceramics. Acta Metall Sin (English Letters) 29(6):505–517
Acknowledgements
The samples used in this study were prepared, at the University of Debrecen, Hungary, according to the agreement between Faculty of Education, Ain Shams University “Coordinator and Supervisor Prof.Dr.Suzan Fouad” and faculty of Science and Technology , University of Debrecen” Coordinator and Supervisor Prof.Dr.Zoltán Erdélyi.” The electrical and dielectric properties were measured in the Electric and Dielectric Measurements Unit, and the hardness measurements were measured in the metal physics laboratory (MPL) at National Research Center (NRC) Egypt. Project No. TKP2021-NKTA-34 has been implemented with the support provided from the National Research, Development and Innovation Fund of Hungary, Financed under the TKP2021-NKTA funding scheme.
Author information
Authors and Affiliations
Contributions
S.S. Fouad:- The idea and the writing and the revision. Eszter Baradács and Bence Parditka:- Prepared samples and made the characterizations. N.F.Osman and M.E.Sayed:- Calculated the different parameters and prepared the results. L.I.Soliman:- Following up all the measurements and Revision. M.Nabil:- Prepared all the figures in the final form and responsible on the correspondence. Zoltán Erdélyi:- Prepared and supervising all the characteristics that had been made in Debrecen.
Corresponding author
Ethics declarations
Conflict of interest
The authors declare that they have no conflict of interest.
Ethical approval
Not applicable.
Additional information
Handling Editor: Catalin Croitoru.
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.
About this article
Cite this article
Fouad, S.S., Soliman, L.I., Baradács, E. et al. Advances for enhancing the electrical properties and microhardness activity of ZnO/Cu/ZnO thin films prepared by ALD. J Mater Sci 58, 6632–6642 (2023). https://doi.org/10.1007/s10853-023-08411-9
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10853-023-08411-9