1. Use of photocurrent-voltage characteristics of MOS structures to determine insulator bulk trapped charge densities and centroids

   • D. J. DiMaria
   • Z. A. Weinberg
   • D. R. Young

   OriginalPaper Pages: 207 - 219

2. Transmission electron microscope study of oxidation-induced

   • J. J. Comer
   • S. A. Roosild

   OriginalPaper Pages: 221 - 236

3. Characterization of GaN epitaxial layers using

   • S. S. Liu
   • T. R. Cass
   • D. A. Stevenson

   OriginalPaper Pages: 237 - 252

4. III-V alloys for optoelectronic applications

   • C. J. Nuese

   OriginalPaper Pages: 253 - 293

5. Degradation of GaP:N LEDs

   • G. B. Stringfellow
   • T. R. Cass
   • R. A. Burmeister

   OriginalPaper Pages: 295 - 318

6. A study of properties of plastics used for

   • Anh Quach
   • W. L. Hunter

   OriginalPaper Pages: 319 - 331

7. Application of thermal analysis

   • E. D. Pierron
   • G. E. Bobos

   OriginalPaper Pages: 333 - 348

8. Recent advances in the production

   • M. R. Montierth

   OriginalPaper Pages: 349 - 372

9. Experimental investigation of the excess charge

   • M. P. Godlewski
   • Henry W. Brandhorst
   • C. T. Sah

   OriginalPaper Pages: 373 - 382