Structural analysis of Ge x Si1−x /Si layers by remote plasma-enhanced chemical vapor deposition on Si (100) R. QianB. AnthonyA. Tasch OriginalPaper Pages: 395 - 399
Superplastic creep of low melting point solder joints Z. MeiJ. W. Morris OriginalPaper Pages: 401 - 407
Weak-beam stereomicrography of defects in GaAs/In x Ga1−x As interfaces Kathleen R. Breen OriginalPaper Pages: 409 - 418
Properties of solid-state electrochromic cells using Ta2O5 as electrolyte M. KitaoH. AkramS. Yamada OriginalPaper Pages: 419 - 422
Injection-enhanced transformation of luminescence spectra of green GaP:N light-emitting diodes T. V. Torchinskaya OriginalPaper Pages: 423 - 429
The role of outdiffusion in the activation of high dose Mg implantations in InP W. H. Van BerloM. GhaffariG. Landgren OriginalPaper Pages: 431 - 435
Optical characterization of AlGaN-GaN-AlGaN quantum wells S. KrishnankuttyR. M. KolbasD. T. Olson OriginalPaper Pages: 437 - 440
Plasma and wet chemical etching of In0.5Ga0.5P J. R. LothianJ. M. KuoS. J. Pearton OriginalPaper Pages: 441 - 445
Process characterization and evaluation of hydride VPE grown Ga x In1−x As using a Ga/In alloy source Chinho ParkVladimir S. BanKenneth P. Quinlan OriginalPaper Pages: 447 - 454
The pattern dependence of selectivity in low pressure selective epitaxial silicon growth J. T. FitchD. J. DenningD. Beard OriginalPaper Pages: 455 - 462
Characterization of deep traps in semi-insulating gallium arsenide D. I. Desnica OriginalPaper Pages: 463 - 471