1. Antiphase boundary of GaAs films grown on Si(001) substrates by molecular beam epitaxy

   • Hitoshi Kawanami
   • Akiteru Hatayama
   • Yutaka Hayashi

   OriginalPaper Pages: 341 - 349

2. Behaviour of erbium implanted in InP

   • C. Rochaix
   • A. Rolland
   • M. Salvi

   OriginalPaper Pages: 351 - 354

3. Physical properties of memory quality PECVD silicon nitride

   • M. A. Khaliq
   • Q. A. Shams
   • H. A. Naseem

   OriginalPaper Pages: 355 - 359

4. The properties of CuInSe₂-MnSe crystals

   • Jyh-Rong Gong
   • Helmut Neff
   • Klaus J. Bachmann

   OriginalPaper Pages: 361 - 363

5. Properties of low-temperature (80-300° C) pyrolytic SiO₂ on Si and InP

   • B. R. Bennett
   • K. Vaccaro
   • A. Davis

   OriginalPaper Pages: 365 - 371

6. Electron microscopy characterization of Au/Ni contacts to p-type InP

   • D. G. Ivey
   • R. Bruce
   • G. R. Piercy

   OriginalPaper Pages: 373 - 380

7. The inverted horizontal reactor: Growth of uniform InP and GaInAs by LPMOCVD

   • N. Puetz
   • G. Hillier
   • A. J. Springthorpe

   OriginalPaper Pages: 381 - 386

8. Stress relaxation in 60Sn-40Pb solder joints

   • D. Tribula
   • D. Grivas
   • J. W. Morris

   OriginalPaper Pages: 387 - 390

9. Effect of iso-electronic dopants on the dislocation density of GaAs

   • G. M. Blom
   • J. M. Woodall

   OriginalPaper Pages: 391 - 396

10. Barrier effect of e-beam evaporated tungsten interlayer in Al/W/PtSi metallization layer

    • Bi-Shiou Chiou
    • Han-Sang Lo
    • Peng-Heng Chang

    OriginalPaper Pages: 397 - 404

11. Characterization of silicon ion-implantation damage in single-strained-layer (InGa)As/GaAs quantum wells

    • D. R. Myers
    • G. W. Arnold
    • B. L. Doyle

    OriginalPaper Pages: 405 - 409

12. Foreword

    • John E. Sanchez

    EditorialNotes Pages: 411 - 411

13. Modeling of chemical vapor deposition reactors

    • A. Sherman

    OriginalPaper Pages: 413 - 423

14. Microstructure of reactively sputtered oxide diffusion barriers

    • E. Kolawa
    • C. W. Nieh
    • M. -A. Nicolet

    OriginalPaper Pages: 425 - 432

15. Interfacial reactions of cobalt thin films on (001) GaAs

    • F. Y. Shiau
    • Y. A. Chang
    • L. J. Chen

    OriginalPaper Pages: 433 - 441

16. Theory of orientation textures due to surface energy anisotropies

    • Jean E. Taylor
    • John W. Cahn

    OriginalPaper Pages: 443 - 445

17. Computer simulation of microstructural evolution in thin films

    • H. J. Frost
    • C. V. Thompson

    OriginalPaper Pages: 447 - 458

18. Development and evolution of thin film microstructures: A Monte Carlo approach

    • S. Ling
    • M. P. Anderson

    OriginalPaper Pages: 459 - 466

19. Activation energies associated with current noise of thin metal films

    • J. G. Cottle
    • T. M. Chen

    OriginalPaper Pages: 467 - 471

20. Electromigration in the presence of a temperature gradient: Experimental study and modelling

    • A. P. Schwarzenberger
    • C. A. Ross
    • A. L. Greer

    OriginalPaper Pages: 473 - 478