Antiphase boundary of GaAs films grown on Si(001) substrates by molecular beam epitaxy Hitoshi KawanamiAkiteru HatayamaYutaka Hayashi OriginalPaper Pages: 341 - 349
Physical properties of memory quality PECVD silicon nitride M. A. KhaliqQ. A. ShamsH. A. Naseem OriginalPaper Pages: 355 - 359
The properties of CuInSe2-MnSe crystals Jyh-Rong GongHelmut NeffKlaus J. Bachmann OriginalPaper Pages: 361 - 363
Properties of low-temperature (80-300° C) pyrolytic SiO2 on Si and InP B. R. BennettK. VaccaroA. Davis OriginalPaper Pages: 365 - 371
Electron microscopy characterization of Au/Ni contacts to p-type InP D. G. IveyR. BruceG. R. Piercy OriginalPaper Pages: 373 - 380
The inverted horizontal reactor: Growth of uniform InP and GaInAs by LPMOCVD N. PuetzG. HillierA. J. Springthorpe OriginalPaper Pages: 381 - 386
Stress relaxation in 60Sn-40Pb solder joints D. TribulaD. GrivasJ. W. Morris OriginalPaper Pages: 387 - 390
Effect of iso-electronic dopants on the dislocation density of GaAs G. M. BlomJ. M. Woodall OriginalPaper Pages: 391 - 396
Barrier effect of e-beam evaporated tungsten interlayer in Al/W/PtSi metallization layer Bi-Shiou ChiouHan-Sang LoPeng-Heng Chang OriginalPaper Pages: 397 - 404
Characterization of silicon ion-implantation damage in single-strained-layer (InGa)As/GaAs quantum wells D. R. MyersG. W. ArnoldB. L. Doyle OriginalPaper Pages: 405 - 409
Microstructure of reactively sputtered oxide diffusion barriers E. KolawaC. W. NiehM. -A. Nicolet OriginalPaper Pages: 425 - 432
Interfacial reactions of cobalt thin films on (001) GaAs F. Y. ShiauY. A. ChangL. J. Chen OriginalPaper Pages: 433 - 441
Theory of orientation textures due to surface energy anisotropies Jean E. TaylorJohn W. Cahn OriginalPaper Pages: 443 - 445
Computer simulation of microstructural evolution in thin films H. J. FrostC. V. Thompson OriginalPaper Pages: 447 - 458
Development and evolution of thin film microstructures: A Monte Carlo approach S. LingM. P. Anderson OriginalPaper Pages: 459 - 466
Activation energies associated with current noise of thin metal films J. G. CottleT. M. Chen OriginalPaper Pages: 467 - 471
Electromigration in the presence of a temperature gradient: Experimental study and modelling A. P. SchwarzenbergerC. A. RossA. L. Greer OriginalPaper Pages: 473 - 478