Volume 42, Issue 2, February 2013
Pb-free Solders and Materials for Emerging Interconnect and Packaging Technologies
ISSN: 0361-5235 (Print) 1543-186X (Online)
In this issue (17 articles)
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OriginalPaper
The Role of Pd in Sn-Ag-Cu Solder Interconnect Mechanical Shock Performance
Pages 215-223 -
OriginalPaper
Effect of Alloying Elements on the Electrification–Fusion Phenomenon in Sn-Based Eutectic Alloys
Pages 249-255 -
OriginalPaper
Influence of Composition on the Morphology of Primary Cu6Sn5 in Sn-4Cu Alloys
Pages 256-262 -
OriginalPaper
Linkages Between Microstructure and Mechanical Properties of Ultrafine Interconnects
Pages 263-271 -
OriginalPaper
Micro- and Nanostructure of Zn Whiskers and Their Coating
Pages 272-279 -
OriginalPaper
Retarding Electromigration in Lead-Free Solder Joints by Alloying and Composite Approaches
Pages 280-287 -
OriginalPaper
Physicochemical Properties of Sn-Zn and SAC + Bi Alloys
Pages 288-293 -
OriginalPaper
Creep and Mechanical Properties of Cu6Sn5 and (Cu,Ni)6Sn5 at Elevated Temperatures
Pages 304-311 -
OriginalPaper
Mitigation and Verification Methods for Sn Whisker Growth in Pb-Free Automotive Electronics
Pages 332-347
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