Fast optical detecting media based on semiconductor nanostructures for recording images obtained using charges of free photocarriers P. G. KasherininovA. A. TomasovE. V. Beregulin Review 15 February 2011 Pages: 1 - 20
Chlorine adsorption on the InAs (001) surface A. V. BakulinS. V. EremeevS. E. Kulkova Nonelectronic Properties of Semiconductors (Atomic Structure, Diffusion) 15 February 2011 Pages: 21 - 29
The influence of γ-ray radiation on electrical properties of CuGaSe2 I. KasumogluT. G. KerimovaI. A. Mamedova Electronic Properties of Semiconductors 15 February 2011 Pages: 30 - 32
Grain boundary related electrical transport in Al-rich Al x Ga1 − x N layers grown by metal-organic chemical vapor deposition A. YildizP. TasliE. Ozbay Electronic Properties of Semiconductors 15 February 2011 Pages: 33 - 36
Features of the charge-transport mechanism in layered Bi2Te3 single crystals doped with chlorine and terbium N. A. AbdullaevN. M. AbdullaevS. A. Nemov Electronic Properties of Semiconductors 15 February 2011 Pages: 37 - 42
On the resonant donor level in n-CdTe according to data on electron transport under hydrostatic pressure M. I. DaunovA. S. KovalevA. B. Magomedov Electronic Properties of Semiconductors 15 February 2011 Pages: 43 - 46
A thermally induced junction between impurity-conduction and intrinsic-conduction regions M. M. GadjialievI. K. KamilovZ. Sh. Pirmagomedov Electronic Properties of Semiconductors 15 February 2011 Pages: 47 - 48
Conductivity of Hg3In2Te6 crystals in high electric fields O. G. GrushkaS. M. ChupyraI. I. Zabolotsky Electronic Properties of Semiconductors 15 February 2011 Pages: 49 - 51
Current-voltage characteristics of ZnGa2Se4 compound polycrystals B. G. TagievO. B. TagievS. G. Asadullayeva Electronic Properties of Semiconductors 15 February 2011 Pages: 52 - 55
The morphology, electron structure, and optical properties of self-assembled silicon nanostructures on the surface of highly oriented pyrolytic graphite A. V. NezhdanovD. O. FilatovA. V. Ershov Surfaces, Interfaces, and Thin Films 15 February 2011 Pages: 56 - 60
Measurement of surface recombination velocity and bulk lifetime in Si wafers by the kinetics of excess thermal emission A. V. ZinovchukA. K. Tkachenko Surfaces, Interfaces, and Thin Films 15 February 2011 Pages: 61 - 65
On the maximum thickness of the space-charge region of reverse biased p +-n junctions with a positive bevel A. S. Kyureguan Surfaces, Interfaces, and Thin Films 15 February 2011 Pages: 66 - 68
the effect of the periphery of metal-semiconductor Schottky-barrier contacts on their electrical characteristics N. A. TorkhovV. A. Novikov Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena 15 February 2011 Pages: 69 - 84
On the nature of electroluminescence at 1.5 μm in the breakdown mode of reverse-biased Er-doped silicon p-n-junction structures grown by sublimation molecular beam epitaxy A. V. KornaukhovA. A. EzhevskiiV. G. Shengurov Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena 15 February 2011 Pages: 85 - 90
Modeling of the hysteretic phenomena in RHEED intensity variation versus temperature for GaAs and InAs surfaces Ákos NemcsicsJenö Takács Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena 15 February 2011 Pages: 91 - 95
Type-I semiconductor heterostructures with an indirect-gap conduction band T. S. Shamirzaev Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena 15 February 2011 Pages: 96 - 102
Temperature-dependent excitonic absorption in long-period multiple In x Ga1 − x As/GaAs quantum well structures S. A. VaganovR. P. Seisyan Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena 15 February 2011 Pages: 103 - 109
Electron-electron interaction and spin-orbit coupling in InAs/AlSb heterostructures with a two-dimensional electron gas V. I. GavrilenkoS. S. KrishtopenkoM. Goiran Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena 15 February 2011 Pages: 110 - 117
Electrical, optical, and mechanical properties of amorphous hydrogenated carbon obtained under various deposition conditions A. A. BabaevS. B. SultanovE. I. Terukov Amorphous, Vitreous, and Organic Semiconductors 15 February 2011 Pages: 118 - 120
Influence of dislocations on the process of pore formation in n-InP (111) single crystals Y. A. SuchikovaV. V. KidalovG. A. Sukach Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors 15 February 2011 Pages: 121 - 124
The effect of thermal annealing on the structure of nanocrystalline zinc sulfide films P. N. KrylovE. A. RomanovI. V. Fedotova Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors 15 February 2011 Pages: 125 - 129
Dependence of the concentration of ionized donors on epitaxy temperature for Si:Er/Si layers grown by sublimation molecular-beam epitaxy V. P. KuznetsovV. B. ShmaginZ. F. Krasilnik Fabrication, Treatment, and Testing of Materials and Structures 15 February 2011 Pages: 130 - 133
The effect of neutron irradiation and annealing temperature on the electrical properties and lattice constant of epitaxial gallium nitride layers V. M. BoykoS. S. VerevkinV. A. Chevychelov Fabrication, Treatment, and Testing of Materials and Structures 15 February 2011 Pages: 134 - 140