Abstract
Polycrystalline CdTe films have been produced on various substrates (glass, ITO-coated glass, sapphire, and microtextured silicon) by quasi-closed space growth, and their structural perfection and surface morphology have been studied by optical microscopy and scanning electron microscopy. Using an energy dispersive X-ray spectrometer and the scanning electron microscope, we have obtained the X-ray emission spectra of the CdTe films and determined their elemental composition. The morphological features of the films have been investigated and the cadmium-to-tellurium atomic ratio in the films has been determined experimentally.
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Original Russian Text © G.A. Il’chuk, I.V. Kurilo, R.Yu. Petrus’, V.V. Kus’nezh, T.N. Stan’ko, 2013, published in Neorganicheskie Materialy, 2013, Vol. 49, No. 4, pp. 341–346.
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Il’chuk, G.A., Kurilo, I.V., Petrus’, R.Y. et al. Morphology, structure, and composition of polycrystalline CdTe films grown on three-dimensional silicon substrates. Inorg Mater 49, 329–334 (2013). https://doi.org/10.1134/S0020168513030059
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DOI: https://doi.org/10.1134/S0020168513030059