Collection

Integrated Optoelectronic Devices

This special issue outlines the significance of automatic failure analysis in integrated optoelectronic devices for advancing the applications of industry 4.0 in real time.

See the Journals Update page for more information https://www.springer.com/journal/11082/updates/25335492

Editors

  • Dr. Manimurugan S

    University of Tabuk, Tabuk City, Saudi Arabia. manimurugan@ut.edu.sa

  • Dr. Paulo Antunes

    Physics Department, University of Aveiro, Portugal pantunes@ua.pt

  • Dr. Jose Alfredo Alvarez-Chavez

    University of Twente, Netherlands j.a.alvarezchavez@utwente.nl

Articles (31 in this collection)