Abstract
Optical lithography is the dominant method of manufacturing lateral microand nanostructures in nearly all areas of technology, but it is predicted to be limited to feature sizes of about 100 nm due to diffraction. At this scale the miniaturization is not yet impaired by quantum limits of the substrates and materials used for construction, i.e. transistors will still be governed by the same physical laws as the currently available components. Therefore nanofabrication of known devices may continue beyond this border without a conceptual change of important components involved, provided suitable lithographic processes with sub 100 nm resolution are available. According to the “roadmap” published by the semiconductor industry [1] it is expected that the technological 100 nm barrier will be reached by 2005. The applicability of sub 100 nm methods for nanostructure fabrication will not only be determined by technological and physical reasons, however, but more importantly by economical factors.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Semiconductor Industry Roadmap, http://notes.sematech.org/97pelec.htm
W.D.Phillips, in Laser Cooling and Trapping of Neutral Atoms, Laser Manipulations of Atoms and Ions, edited by E.Arimondo, W.D.Phillips, and F.Strumia, (North-Holland, Amsterdam, 1992).
C.S.Adams, M.Sigel, and J.Mlynek, Phys. Rep. 240, 143 (1994).
G.Timp, R.E.Behringer, D.M.Tennant, J.E.Cunningham, M.Prentiss, and K.K.Berggren, Phys. Rev. Lett. 69, 1636 (1992).
J.J.McClelland, R.E.Scholten, E.C.Palm, and R.J.Celotta, Science 262, 877 (1993).
U.Drodowsky, J.Stuhler, B.Brezger, T.Schulze, M.Drewsen, T.Pfau, and J.Mlynek, Microelectron. Eng. 35, 285 (1997).
R.W.McGowan, D.M.Giltner, and S.A.Lee, Opt. Lett. 20, 2535 (1995).
K.K.Berggren, A.Bard, J.L.Wilbur, J.D.Gillespy, A.G.Helg, J.J.McClelland, S.L.Rolston, W.D.Phillips, M.Prentiss, and G.M.Whitesides, Science 269, 1255 (1995).
S.Nowak, T.Pfau, and J.Mlynek, Appl. Phys. B 63, 203 (1996).
S.J.Rehse, A.D.Glueck, S.A.Lee, A.B.Goulakov, C.S.Menoni, D.C.Ralph, K.S.Johnson, and M.Prentiss, Appl. Phys. Lett. 71, 1427 (1997).
M.Kreis, F.Lison, D.Haubrich, S.Nowak, T.Pfau, and D.Meschede Appl. Phys. B 63, 649 (1996).
K.K.Berggren, R.Younkin, E.Cheung, M.Prentiss, A.Black, G.M.Whitesides, D.C.Ralph, C.T.Black, and M.Tinkham, Adv. Mat. 9, 52 (1997).
K.S.Johnson, J.H.Thywissen, N.H.Dekker, K.K.Berggren, A.P.Chu, R.Younkin, and M.Prentiss, Science 280, 1583 (1998).
J.Dalibard and C.Cohen-Tannoudji, J. Opt. Soc. Am. B 2, 1707 (1985).
J.J.McClelland, and M.R.Scheinfein, J. Opt. Soc. Am. B 8, 1974 (1991).
J.Dalibard and C.Cohen-Tannoudji, J. Opt. Soc. Am. B 6, 2023 (1989).
R.Gupta, J.J.McClelland, Z.J.Jabbour, and R.J.Celotta, Appl. Phys. Lett. 67, 1378 (1995).
U.Drodofsky, J.Stuhler, Th.Schulze, M.Drewsen, B.Brezger, T.Pfau, and J.Mlynek, Appl. Phys. B 65, 755 (1997).
R.Gupta, J.J.McClelland, R.J.Celotta, and P.Marte, Phys. Rev. Lett. 76, 4689 (1996).
C.D.Bain, E.B.Troughton, Y.-T.Tao, J.Evall, G.M.Whitesides, and R.G. Nuzzo, J. Am. Chem. Soc. 111, 321 (1989).
L.Strong and G.M.Whitesides, Langmuir 4, 546 (1988).
F.Lison, H.-J.Adams, D.Haubrich, M.Kreis, S.Nowak, and D.Meschede Appl. Phys. B 65, 419 (1997).
R.Younkin, K.K.Berggren, K.S.Johnson, D.C.Ralph, M.Prentiss, and G.M.Whitesides, Appl. Phys. Lett. 71, 1261 (1997).
J.D.Joannopoulos, R.D.Meade, and J.N.Winn, in Photonic Crystals, (Princeton University Press, Princeton, 1995).
[25] W.G.Kaenders, F.Lison, A.Richter, R.Wynands, and D.Meschede, Nature 375, 214 (1995). W.G.Kaenders, F.Lison, I.Müller, A.Richter, R.Wynands, and D.Meschede, Phys. Rev. A54, 5067 (1996).
W.Ertmer, R.Blatt, J.L.Hall, and M.Zhu, Phys. Rev. Lett. 54, 996(1985).
W.D.Phillips and H.Metcalf, Phys. Rev. Lett. 48, 596 (1982).
[28] F.Lison, P.Schuh, D.Haubrich, D.Meschede, to appear in Phys. Rev. A.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2001 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Lison, F., Haubrich, D., Meschede, D. (2001). Atom Lithography with Cesium Atomic Beams. In: Campargue, R. (eds) Atomic and Molecular Beams. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-56800-8_13
Download citation
DOI: https://doi.org/10.1007/978-3-642-56800-8_13
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-63150-4
Online ISBN: 978-3-642-56800-8
eBook Packages: Springer Book Archive