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Using an Automated Complex Micron to Determine Measurement Error of Microwave Radio Interferometers

  • RADIO MEASUREMENTS
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Measurement Techniques Aims and scope

This article presents the technique of radio interferometry measurements and a theoretical estimate of the measuring error of the reflecting surface displacement. The displacements are measured using microwave radio interferometers. This article describes the automated complex Micron design as well as its operating principle. The complex is designed to experimentally determine the error in measuring the reflecting surface displacement as well as to conduct primary and periodic verification of microwave radio interferometers. The complex Micron comprises a measuring tool of the precision class 3, that is, an incremental linear displacement transducer LIR-7A, which measures the reflecting surface displacement of the test object. Verification of the longitudinal displacement measuring line is provided for the complex Micron so that the LIR-7A transducer can be verified without dismantling it. Parallel slip gauges or similar standards can be used as the initial standard for verification. The measured displacement values, determined during verification and obtained through an alternative method providing the required accuracy of radio interferometry measurements, were compared.

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Authors and Affiliations

  1. Russian Federal Nuclear Center – All-Russia Research Institute of Experimental Physics (RFYaTs – VNIIEF), Sarov, Russia

    D. E. Bezrukov, N. S. Kornev, N. A. Makarichev, K. V. Mineev, A. V. Nazarov & D. A. Tregubenko

Authors
  1. D. E. Bezrukov
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  2. N. S. Kornev
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  3. N. A. Makarichev
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  4. K. V. Mineev
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  5. A. V. Nazarov
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  6. D. A. Tregubenko
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Corresponding author

Correspondence to D. E. Bezrukov.

Additional information

Translated from Izmeritel’naya Tekhnika, No. 10, pp. 60–64, October, 2020.

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Bezrukov, D.E., Kornev, N.S., Makarichev, N.A. et al. Using an Automated Complex Micron to Determine Measurement Error of Microwave Radio Interferometers. Meas Tech 63, 834–838 (2021). https://doi.org/10.1007/s11018-021-01861-0

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  • DOI: https://doi.org/10.1007/s11018-021-01861-0

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