1. Introduction

   • Thomas Walther
   • Rafal E. Dunin-Borkowski
   • Eric A. Stach

   Aberration Corrected Transmission Electron Microscopy 14 March 2017 Pages: 911 - 911

2. Recent studies of oxide-semiconductor heterostructures using aberration-corrected scanning transmission electron microscopy

   • David J. Smith
   • HsinWei Wu
   • Martha R. McCartney

   Invited Article 01 August 2016 Pages: 912 - 920

   

3. Observation of compound semiconductors and heterovalent interfaces using aberration-corrected scanning transmission electron microscopy

   • David J. Smith
   • Jing Lu
   • Yong-Hang Zhang

   Invited Feature Paper 30 August 2016 Pages: 921 - 927

   

4. New insights on ion track morphology in pyrochlores by aberration corrected scanning transmission electron microscopy

   • Ritesh Sachan
   • Yanwen Zhang
   • William J. Weber

   Review 13 December 2016 Pages: 928 - 935

   

5. Comparison of convergent beam electron diffraction and annular bright field atomic imaging for GaN polarity determination

   • Alexana Roshko
   • Matt D. Brubaker
   • Igor Levin

   Article 13 December 2016 Pages: 936 - 946

   

6. An effect of crystal tilt on the determination of ions displacements in perovskite oxides under BF/HAADF-STEM imaging mode

   • Y. Liu
   • Y. L. Zhu
   • X. L. Ma

   Article 10 October 2016 Pages: 947 - 956

   

7. 3D polarization texture of a symmetric 4-fold flux closure domain in strained ferroelectric PbTiO₃ films

   • Y. L. Tang
   • Y. L. Zhu
   • X. L. Ma

   Article 12 July 2016 Pages: 957 - 967

   

8. Beam-induced atomic migration at Ag-containing nanofacets at an asymmetric Cu grain boundary

   • Nicolas J. Peter
   • Christian H. Liebscher
   • Gerhard Dehm

   Article 14 November 2016 Pages: 968 - 982

   

9. Study of phase separation in an InGaN alloy by electron energy loss spectroscopy in an aberration corrected monochromated scanning transmission electron microscope

   • Thomas Walther
   • Xiaoyi Wang
   • Toshihiro Aoki

   Article 08 December 2016 Pages: 983 - 995

   

10. Aberration-corrected self-interference of split higher order Laue zone line for measuring the z-dependent strain profile

    • Mana Norouzpour
    • Rodney Herring

    Article 16 January 2017 Pages: 996 - 1008