1. Research/Researchers

   Departments 01 February 2000 Pages: 4 - 6

2. Washington News

   Departments 01 February 2000 Pages: 8 - 9

3. Resources

   Departments 01 February 2000 Pages: 10 - 10

4. Focused MeV Ion Beams for Materials Analysis and Microfabrication

   • Mark B. H. Breese

   Focused Mev Ion Beams for Materials Analysis and Microfabrication 01 February 2000 Pages: 11 - 13

5. Analysis of Integrated Circuits and Semiconductor Materials Using IBIC Microscopy

   • Harald Schöne
   • David N. Jamieson

   Focused MeV Ion Beams for Materials Analysis and Microfabrication 01 February 2000 Pages: 14 - 20

6. Imaging and Analysis of Crystal Defects Using Transmission Channeling

   • Philip King

   Focused MeV Ion Beams for Materials Analysis and Microfabrication 01 February 2000 Pages: 21 - 27

7. Ion-Beam Rocking Measurements of Small Lattice Strains

   • Diane G. de Kerckhove

   Focused MeV Ion Beams for Materials Analysis and Microfabrication 01 February 2000 Pages: 28 - 32

8. Single-Ion Micromechanics

   • B. E. Fischer
   • S. Metzger

   Focused MeV Ion Beams for Materials Analysis and Microfabrication 01 February 2000 Pages: 39 - 42

9. A Centennial Report

   • Alan Cottrell

   Materials Challenges For The Next Century 01 February 2000 Pages: 43 - 46

10. MRS Featured Volunteer

    • Julia M. Phillips

    MRS News 01 February 2000 Pages: 47 - 49

11. Ceramist Applies Materials Processing and Characterization Background to Innovative Product Development in Food Packaging

    • Amitabha Kumar

    Departments 01 February 2000 Pages: 50 - 50

12. Impurities in Engineering Materials: Impact, Reliability and Control

    Departments 01 February 2000 Pages: 51 - 51

13. Electronic Genie: The Tangled History of Silicon

    Departments 01 February 2000 Pages: 51 - 51

14. March 2000 Journal of Materials Research

    Abstracts 01 February 2000 Pages: 52 - 54