Molecule formation in electrothermal atomizers: Interferences and analytical possibilities by absorption, emission and fluorescence processes K. DittrichB. HanischH. -J. Stärk Lectures Pages: 497 - 506
Improving signal-to-noise by evaluation of correlation functions Klaus DoerffelAndreas WundrackSampurna Tarigopula Lectures Pages: 507 - 510
Analytical inductively coupled plasma spectroscopies — past, present, and future Velmer A. Fassel Lectures Pages: 511 - 518
Informationstheorie — Ein Mittel für die Bewertung der spektrochemischen Mehrkomponenten-Analysenmethoden K. FlóriánM. Matherny Vorträge Pages: 525 - 530
Analysis of environmental materials using spectroscopic methods Keiichiro Fuwa Lectures Pages: 531 - 536
Applications of infrared and Raman spectroscopy in industry J. G. GrasselliM. MehicicJ. R. Mooney Lectures Pages: 537 - 543
Ions or photons — an assessment of the relationship between emission and mass spectrometry with the ICP A. L. Gray Lectures Pages: 561 - 570
Diffuse reflection and polarization modulation FT-IR spectrometry of surface species Peter R. GriffithsKenneth W. Van EveryNorman A. Wright Lectures Pages: 571 - 578
High accuracy in the element analysis by mass spectrometry Klaus G. Heumann Lectures Pages: 601 - 611
State of the art of coherent forward scattering spectroscopy Kichinosuke Hirokawa Lectures Pages: 612 - 617
