Thermo-induced control of the dispersion properties of crystals V. N. TrushinA. S. MarkelovE. V. Chuprunov Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 1 - 4
Locally induced charged polarization states in manganites R. F. MaminD. A. BizyaevA. A. Bukharaev Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 5 - 8
A phase compensating inverse-dynamics method for high-speed AFM imaging I. M. MalovichkoA. Yu. OstashenkoS. I. Leesment Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 9 - 11
The structure and properties of the Si nanostructures on an HOPG surface D. O. FilatovD. A. AntonovA. I. Mashin Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 12 - 16
The photomagnetic effect in Mn delta-doped heteronanostructures with an InGaAs/GaAs quantum well I. A. KarpovichO. E. KhapuginE. A. Gorbacheva Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 17 - 20
The dynamic field effect in Mn delta-doped quantum wells and In(Ga)As/GaAs quantum dot heteronanostructures I. A. KarpovichL. A. Istomin Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 21 - 24
Controlling the self-organization of InAs quantum dots upon growth by means of vapor-phase epitaxy on an antimony δ-doped GaAs buffer layer A. V. ZdoroveishchevN. V. Baidus’P. B. Demina Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 25 - 27
Preparing surfaces for the analysis of magnetic structures S. A. GusevB. A. GribkovE. V. Skorokhodov Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 28 - 32
X-ray optics at the Russian academy of Sciences’ institute of high-purity materials D. V. RoshchupkinD. V. IrzhakI. I. Snigireva Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 33 - 35
X-ray scattering in multilayer structures with quantum dots V. I. PunegovN. N. Faleev Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 36 - 39
Direct comparison of superlattice periods measured with X-ray diffractometry and optical interferometry Yu. N. DrozdovM. N. DrozdovD. V. Yurasov Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 40 - 43
Project for manufacturing a Russian EUV nanolithographer for the fabrication of chips according to technological standards of 22 nm N. N. SalashchenkoN. I. Chkhalo Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 44 - 48
A stand for a projection EUV nanolithographer-multiplicator with a design resolution of 30 nm D. G. VolgunovI. G. ZabrodinN. I. Chkhalo Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 49 - 52
A technological complex for manufacturing of precise imaging optics S. Yu. ZuevE. B. KluenkovN. I. Chkhalo Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 53 - 56
Two-mirror projection objective of a nanolithographer at λ = 13.5 nm S. Yu. ZuevA. E. PestovN. I. Chkhalo Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 57 - 60
Evolution of the roughness of amorphous quartz surfaces and Cr/Sc multilayer structures upon exposure to ion-beam etching Yu. A. VainerM. V. ZorinaR. A. Khramkov Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 61 - 63
An extreme ultraviolet radiation source based on plasma heated by millimeter range radiation A. V. VodopyanovS. V. GolubevN. I. Chkhalo Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 64 - 66
Particulars of studying the roughness of substrates for multilayer X-ray optics using small-angle X-ray reflectometry, atomic-force, and interference microscopy M. M. BaryshevaYu. A. VainerN. I. Chkhalo Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 67 - 72
Mo-based EUV multilayer filters with enhanced thermal stability M. N. DrozdovE. B. KluenkovL. A. Shmaenok Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 73 - 75
Evolution of elemental distribution in free-standing structures of Zr/ZrSi2 with MoSi2 and ZrSi2 protective coatings under annealing M. N. DrozdovYu. N. DrozdovL. A. Shmaenok Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 76 - 79
Specular properties of chemically etched polyethylene terephthalate foils in the soft X-ray region S. Yu. ZuevA. V. Mitrofanov Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 80 - 83
Choosing optical materials for diagnostics of the solar atmosphere in the wavelength range of 6–60 nm S. V. KuzinV. N. PolkovnikovN. N. Salashchenko Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 84 - 86
EUV observations of the solar corona with superhigh spatial resolution in the ARCA project S. V. KuzinS. A. BogachevA. S. Ulyanov Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 87 - 90
Photometry of solar EUV radiation by space-based telescopes with normal incidence multilayer-coated optics V. A. Slemzin Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 91 - 96
A method for measuring the shape of a surface of an ellipsoid of rotation on a Talysurf CCI 2000 interference microscope A. A. AkhsakhalyanA. D. AkhsakhalyanA. I. Kharitonov Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 97 - 99
SIMS depth profiling of Pd/B4C, Ni/C, and Cr/Sc multilayer metal structures using registration of cluster secondary ions: The problem of depth resolution enhancement M. N. DrozdovYu. N. DrozdovN. I. Chkhalo Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2010” 23 February 2011 Pages: 100 - 104
Photon echoes upon Raman transitions S. V. Sazonov Proceedings of the XII All-Russia Seminar “The Wave Phenomena in Inhomogeneous Media” 23 February 2011 Pages: 105 - 109
Dynamic problems of composite mechanics V. I. Gorbachev Proceedings of the XII All-Russia Seminar “The Wave Phenomena in Inhomogeneous Media” 23 February 2011 Pages: 110 - 115
Generalized potentiality of inhomogeneous media flows A. N. Golubiatnikov Proceedings of the XII All-Russia Seminar “The Wave Phenomena in Inhomogeneous Media” 23 February 2011 Pages: 116 - 120
Effect of scatterer concealment by double-negative acoustic media K. V. DmitrievI. V. Kortunov Proceedings of the XII All-Russia Seminar “The Wave Phenomena in Inhomogeneous Media” 23 February 2011 Pages: 121 - 125
Nonlinear evolution of periodic gas perturbations A. V. Aksenov Proceedings of the XII All-Russia Seminar “The Wave Phenomena in Inhomogeneous Media” 23 February 2011 Pages: 126 - 130
Viscoplastic flows in channels with variable cross section and deformable walls V. S. Yushutin Proceedings of the XII All-Russia Seminar “The Wave Phenomena in Inhomogeneous Media” 23 February 2011 Pages: 131 - 135
Developing methods and instruments of electromagnetic tomography for studying the human brain and cognitive functions A. K. BabushkinA. S. BugaevV. A. Cherepenin Proceedings of the XII All-Russia Seminar “The Wave Phenomena in Inhomogeneous Media” 23 February 2011 Pages: 136 - 139
Generalized Joseph estimates of stability of plane shear flows with scalar nonlinearity D. V. Georgievskii Proceedings of the XII All-Russia Seminar “The Wave Phenomena in Inhomogeneous Media” 23 February 2011 Pages: 140 - 143