Features of the formation of a perovskite phase in thin polycrystalline Pb(Zr,Ti)O3 films V. P. ProninS. V. SenkevichI. P. Pronin OriginalPaper 12 October 2010 Pages: 703 - 708
Comparison of extended-defect contrasts calculated in the XBIC and EBIC methods E. B. Yakimov OriginalPaper 12 October 2010 Pages: 709 - 711
AFM investigation of films based on UV-solidified powder oligoesterdimethacrylate compositions Yu. V. KotovaT. E. SukhanovaL. N. Mashlyakovsky OriginalPaper 12 October 2010 Pages: 712 - 721
Fabrication of specified-geometry metal pattern by proton irradiation through a single-layer mask B. A. GurovichA. G. DomantovskiiK. I. Maslakov OriginalPaper 12 October 2010 Pages: 722 - 726
Evolution of the phase-structure state during annealing of Fe-ZrN films grown by magnetron sputtering O. M. ZhigalinaD. N. KhmeleninM. Inoue OriginalPaper 12 October 2010 Pages: 727 - 732
Development of the method of electron-optical in situ monitoring for periodic structures M. Yu. BarabanenkovV. V. KazmirukT. N. Savitskaya OriginalPaper 12 October 2010 Pages: 733 - 739
Periodic domain structures obtained by growth of LiNbO3 crystals doped with gadolinium L. S. KokhanchikM. N. PalatnikovO. B. Scherbina OriginalPaper 12 October 2010 Pages: 740 - 746
Electron microscopy investigation of AlMg6 aluminum alloy surface defects caused by microorganisms extracted in space stations T. A. AlekhovaV. Ya. ShkloverA. L. Vasil’ev OriginalPaper 12 October 2010 Pages: 747 - 753
Investigations of electron beam induced conductivity in silicon oxide thin films S. S. BorisovP. S. VergelesE. B. Yakimov OriginalPaper 12 October 2010 Pages: 754 - 757
Comparative study of cathode and magnetron sputtering methods for depositing Pb(TiZr)O3 ferroelectric film V. G. BeshenkovA. G. ZnamenskiiV. A. Marchenko OriginalPaper 12 October 2010 Pages: 758 - 760
Study of elemental and phase composition of PZT thin films by auger depth profiling V. G. BeshenkovV. A. MarchenkoA. G. Znamenskii OriginalPaper 12 October 2010 Pages: 761 - 765
Study of irradiated superconducting films by SPM techniques S. V. AntonenkoS. M. TolkachevaV. A. Frolova OriginalPaper 12 October 2010 Pages: 766 - 768
Oriented surface self-segregation in lead titanate single crystals Yu. Ya. TomashpolskiiN. V. Sadovskaya OriginalPaper 12 October 2010 Pages: 769 - 772
On the technique of absolutization of diffuse scattering intensity measurements based on thermal diffuse scattering measurements V. T. BublikK. D. ShcherbachevE. V. Zhevnerov OriginalPaper 12 October 2010 Pages: 773 - 777
On one possibility of the mathematical modeling of the dependence of cathodoluminescence intensity on the energy of beam electrons with the use of the power series approximation in the problem of identifying the parameters of semiconductor materials T. I. KovtunovaN. N. MikheevM. A. Stepovich OriginalPaper 12 October 2010 Pages: 778 - 783
SIMS diagnostics of the structure of nanometer-sized semiconducting layers doped with impurities A. N. Pustovit OriginalPaper 12 October 2010 Pages: 784 - 787
Peculiarities of electron exchange between a negative hydrogen ion and atomic chains T. N. PolivnikovaK. K. SatarinI. K. Gainullin OriginalPaper 12 October 2010 Pages: 788 - 791
Scanning helium ion microscope: Distribution of secondary electrons and ion channeling Yu. V. PetrovO. F. VyvenkoA. S. Bondarenko OriginalPaper 12 October 2010 Pages: 792 - 795
Investigation into the formation of X-ray photopolymer lenses T. A. SagdullinL. G. Shabel’nikovD. V. Irzhak OriginalPaper 12 October 2010 Pages: 796 - 802
Formation of nanostructures on the surface of polymer films by an atomic force microscope tip A. N. StepanovD. A. Yashunin OriginalPaper 12 October 2010 Pages: 803 - 806
Use of cluster secondary ions for minimization of matrix effects in the SIMS depth profiling of La/B4C multilayer nanostructures M. N. DrozdovYu. N. DrozdovN. I. Chkhalo OriginalPaper 12 October 2010 Pages: 807 - 810
Oriented surface autosegregation in the lead germanate single crystals Yu. Ya. TomashpolskyN. V. Sadovskaya OriginalPaper 12 October 2010 Pages: 811 - 816
The effect of heating on optical properties and radiation resistance of coatings based on micro- and nanosized aluminum oxide powders M. M. MikhailovT. A. BurtsevaA. N. Lapin OriginalPaper 12 October 2010 Pages: 817 - 822
Diffracted channeling radiation for axial electron channeling K. B. KorotchenkoYu. L. PivovarovE. I. Fiks OriginalPaper 12 October 2010 Pages: 823 - 830
Kinetics of the formation of gas bubbles during polarization of copper and graphite electrodes in electrolytic aqueous solutions A. M. OrlovI. O. YavtushenkoM. V. Churilov OriginalPaper 12 October 2010 Pages: 831 - 835
Thin film semiconductor islands and numerical experiment G. I. ZmievskayaA. L. Bondareva OriginalPaper 12 October 2010 Pages: 836 - 844
Radiation damage of material surfaces under prolonged irradiation with He+ and Ar+ ions with broad energy spectra B. A. KalinN. V. VolkovS. V. Zaitsev OriginalPaper 12 October 2010 Pages: 845 - 851
Ion-implanted deuterium accumulation in a deposited tungsten coating V. V. BobkovA. V. OnishchenkoL. P. Tishchenko OriginalPaper 12 October 2010 Pages: 852 - 858
The Schottky barrier at homogeneous impurity distribution in a semiconductor V. B. BondarenkoA. V. FilimonovE. Yu. Koroleva OriginalPaper 12 October 2010 Pages: 859 - 861
Interfacial polarization in statistical mixtures V. A. Sotskov OriginalPaper 12 October 2010 Pages: 862 - 865
Partial local connectivity on different surfaces N. L. Smirnova OriginalPaper 12 October 2010 Pages: 866 - 872
