Use of photocurrent-voltage characteristics of MOS structures to determine insulator bulk trapped charge densities and centroids D. J. DiMariaZ. A. WeinbergD. R. Young OriginalPaper Pages: 207 - 219
Transmission electron microscope study of oxidation-induced J. J. ComerS. A. Roosild OriginalPaper Pages: 221 - 236
Characterization of GaN epitaxial layers using S. S. LiuT. R. CassD. A. Stevenson OriginalPaper Pages: 237 - 252
Degradation of GaP:N LEDs G. B. StringfellowT. R. CassR. A. Burmeister OriginalPaper Pages: 295 - 318
Experimental investigation of the excess charge M. P. GodlewskiHenry W. BrandhorstC. T. Sah OriginalPaper Pages: 373 - 382