Effects of microstructure on interconnect and via reliability: Multimodal failure statistics C. V. ThompsonH. Kahn Special Issue Paper Pages: 581 - 587
Relationship between texture and electromigration lifetime in sputtered AI-1% Si thin films Ann N. CampbellRussell E. MikawaDavid B. Knorr Special Issue Paper Pages: 589 - 596
The microstructure, mechanical stress, texture, and electromigration behavior of Al-Pd alloys K. P. RodbellD. B. KnorrJ. D. Mis Special Issue Paper Pages: 597 - 606
The effect of grain orientation on the relaxation of thermomechanical stress and hillock growth in AI-1%Si conductor layers on silicon substrates R. A. SchwarzerD. Gerth Special Issue Paper Pages: 607 - 610
Texture and microstructure of thin copper films D. P. TracyD. B. Knorr Special Issue Paper Pages: 611 - 616
The correlation of texture and magnetic properties in Co-Cr films Li Cheng-ZhangJ. A. Szpunar Special Issue Paper Pages: 617 - 622
Tensile properties of aluminum/alumina multi-layered thin films G. T. MeariniR. W. Hoffman Special Issue Paper Pages: 623 - 629
Annealing kinetics and embrittlement of electrodeposited copper H. D. Merchant Special Issue Paper Pages: 631 - 638
Transmission electron microscopy of electrodeposits L. A. GiannuzziP. R. HowellW. R. Bitler Special Issue Paper Pages: 639 - 644
The texture of electrodeposited iron foils D. Y. LiJ. A. Szpunar Special Issue Paper Pages: 645 - 651
A Monte-Carlo simulation of the electrodeposition process D. Y. LiJ. A. Szpunar Special Issue Paper Pages: 653 - 657
Annealing of electrolytic Cu-Bi, Ni-Bi, and Co-Bi alloys I. M. KovenskyV. V. Povetkin Special Issue Paper Pages: 659 - 660
Improved control of momentary rapid thermal annnealing for silicidation P. D. AgnelloA. Fink Regular Issue Paper Pages: 661 - 665
Cobalt disilicide as dopant diffusion source for polysilicon gates in MOS devices J. LinW. ChenC. Magee Regular Issue Paper Pages: 667 - 673
Space charge limited conduction in a-Ge22Se68M10 (M = Cd,ln,Pb,Te) S. KumarR. AroraA. Kumar Regular Issue Paper Pages: 675 - 679
Effects of bias-temperature cycling on electrical characteristics of YBCO/YSZ/Si SulS capacitors Eric M. AjimineJianmin QiaoD. K. Fork Regular Issue Paper Pages: 681 - 684
Crystallographic evaluation of ZnSe crystals by x-ray diffraction Yasuo OkunoHitoshi TamuraTsuyoshi Maruyama Regular Issue Paper Pages: 685 - 688
Effect of carbon on thermal oxidation of silicon and electrical properties of SiO2-Si structures R. B. BeckT. BrozekR. E. Tressler Regular Issue Paper Pages: 689 - 694
Phase studies of the Cd-Fe-Se system in the Cd-rich region Heribert WiedemeierXuejun Huang Regular Issue Paper Pages: 695 - 699
Structure of organometallic chemical vapor deposited BaTiO3 thin films on LaAIO3 J. ChenL. A. WillsT. J. Marks Letter Pages: 701 - 703